Near-field scanning Raman microscopy using apertureless probes

Journal of Raman Spectroscopy

Volumn 34, Issue 9, 2003, Pages 668-676

  Sun, W X ^a   Shen, Z X ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Apertureless probe; Near field; Raman imaging; Raman microscopy

Indexed keywords

METAL COATINGS; MICROSCOPES; OPTICAL FIBER FABRICATION; OPTICAL FIBERS;

APERTURELESS PROBES; NEAR FIELDS; NEAR-FIELD SCANNING; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; RAMAN IMAGING; RAMAN MICROSCOPE; RAMAN MICROSCOPY; RAMAN SPECTROMETERS; REFLECTION GEOMETRY; UNIQUE FEATURES;

PROBES;

GLASS FIBER; SILICON;

ARTICLE; IMAGING; LIGHT SCATTERING; MATERIAL COATING; NANOTECHNOLOGY; NEAR FIELD SCANNING RAMAN MICROSCOPY; RAMAN SPECTROMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0141483267     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/jrs.1063     Document Type: Article

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