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Volumn 542, Issue 1-2, 2003, Pages 56-63
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Effect of humidity on nano-oxidation of p-Si(0 0 1) surface
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Author keywords
Atomic force microscopy; Oxidation; Silicon; Water
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Indexed keywords
ATMOSPHERIC HUMIDITY;
ATOMIC FORCE MICROSCOPY;
DIFFUSION;
ELECTRIC POTENTIAL;
SILICON WAFERS;
NANO-OXIDATION;
OXIDATION;
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EID: 0042389706
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(03)00912-9 Document Type: Article |
Times cited : (46)
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References (17)
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