Photothermal microscopy for in-situ study of laser damage induced by gold inclusions

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4932, Issue , 2003, Pages 374-384

  During, Annelise ^a   Commandré, Mireille ^a   Fossati, Caroline ^a   Natoli, Jean Yves ^a   Rullier, Jean Luc ^b   Bercegol, Hervé ^b   Bouchut, Philippe ^c  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b CEA DAM DIF   (France)

^c CEA GRENOBLE   (France)

Author keywords

Absorption; Gold inclusions; Laser damage; Optical thin films; Photothermal deflection

Indexed keywords

ABSORPTION; CAMERAS; CHARGE COUPLED DEVICES; DIELECTRIC MATERIALS; GOLD; INCLUSIONS; THIN FILMS;

PHOTOTHERMAL MICROSCOPY;

LASER DAMAGE;

EID: 0041861003     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.472434     Document Type: Conference Paper

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