Multiwavelength imaging of defects in ultraviolet optical materials

Applied Optics

Volumn 41, Issue 16, 2002, Pages 3118-3126

  During, Annelise ^a   Fossati, Caroline ^a   Commandré, Mireille ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; FUSED SILICA; IMAGING TECHNIQUES; LASER DAMAGE; LIGHT ABSORPTION; LIGHT SCATTERING; SUBSTRATES; THIN FILMS; ULTRAVIOLET RADIATION;

MULTIWAVELENGTH IMAGING;

OPTICAL MATERIALS;

EID: 0036603144     PISSN: 00036935     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.41.003118     Document Type: Conference Paper

References (33)

1. Pulsed laser-induced damage to thin-film optical coatings. II. Theory
2. Role of defects in laser damage of multilayer coatings
3. Nano absorbing centers: A key point in the laser damage of thin films
4. Modeling of laser-induced surface cracks in silica at 355 nm
5. Thermoelastic and ablation mechanisms of laser damage to the surface of transparent solids
6. Examination of laser damage sites of transparent surfaces and films using internal reflection microscopy
7. Total internal reflection microscopy: A surface inspection technique
8. Application of total internal reflection microscopy for laser damage studies on fused silica
9. Light scattering from multilayer optics. I. Tools of investigation
10. Light scattering from multilayer optics. II. Application to experiment
11. Light scattering from the volume of optical thin films: Theory and experiment
12. AFM-mapped nanoscale absorber-driven laser damage in LTV high-reflector multilayers
13. Characterization of defect geometries in multilayer optical coatings
14. Photothermal measurements on optical thin films
15. Absorption measurements
16. Characterization of optical coatings by photothermal deflection
17. Absorption mapping for characterization of glass surfaces
18. Absorption and thermal conductivity of oxide thin films measured by photothermal displacement and reflectance methods
19. Micrometer resolved photothermal displacement inspection of optical coating
20. Micro-meter resolved inspection of defects and laser damage sites in LTV high-reflecting coatings by photothermal displacement microscopy
21. 2 single-layer films
22. New insight into defect-induced laser damage in LTV multilayer coatings
23. Investigation of the absorption induced damage in ultraviolet dielectric thin films
24. Optical absorption and ionization of silicate glasses
25. Untersuchungen zu ISO standardmessverfarhen zur charakterisierung optischer laserkomponenten
26. Test method for radiation scattered by optical components
27. Multi-wavelength imaging of defects in UV optical materials
28. 2 films by a collinear photothermal deflection technique
29. Characterization of absorption by photothermal deflection