-
1
-
-
58149316379
-
Nano absorbing centers: A key point in laser damage of thin films
-
H. Bennett, A. Guenther, M. Kozlowski, B. Newman, and M. Soileau, eds., Proc. SPIE
-
J. Dijon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers: a key point in laser damage of thin films,” in Laser-Induced Damage in Optical Materials: 1996, H. Bennett, A. Guenther, M. Kozlowski, B. Newman, and M. Soileau, eds., Proc. SPIE 2966, 315-325 (1997).
-
(1997)
Laser-Induced Damage in Optical Materials: 1996
, vol.2966
, pp. 315-325
-
-
Dijon, J.1
Poiroux, T.2
Desrumaux, C.3
-
2
-
-
57849094578
-
AFM-mapped, nanoscale, absorber-driven laser damage in UV high reflector multilayer
-
A. Guenther, M. Kozlowski, B. Newnam, and M. Soileau, eds., Proc. SPIE
-
S. Papernov, A. Schmid, J. Anzelotti, D. Smith, and Z. Chrzan, “AFM-mapped, nanoscale, absorber-driven laser damage in UV high reflector multilayer,” in 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, A. Guenther, M. Kozlowski, B. Newnam, and M. Soileau, eds., Proc. SPIE 2714, 384-394 (1996).
-
(1996)
27Th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
, vol.2714
, pp. 384-394
-
-
Papernov, S.1
Schmid, A.2
Anzelotti, J.3
Smith, D.4
Chrzan, Z.5
-
3
-
-
0034853684
-
Using colloidal gold nanoparticles for studies of laser interaction with defects in thin films
-
G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE
-
S. Papernov, A. Schmid, R. Krishnan, and L. Tsybeskov, “Using colloidal gold nanoparticles for studies of laser interaction with defects in thin films,” in Laser-Induced Damage in Optical Materials: 2000, G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE 4347, 146-154 (2001).
-
(2001)
Laser-Induced Damage in Optical Materials: 2000
, vol.4347
, pp. 146-154
-
-
Papernov, S.1
Schmid, A.2
Krishnan, R.3
Tsybeskov, L.4
-
4
-
-
0034840551
-
Quantitative study of laser damage threshold curves in silica and calibrated liquids: Comparison with theoretical prediction
-
G. Ex-arhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE
-
J. Y. Natoli, L. Gallais, H. Akhouayri, and C. Amra, “Quantitative study of laser damage threshold curves in silica and calibrated liquids: comparison with theoretical prediction,” in Laser-Induced Damage in Optical Materials: 2000, G. Ex-arhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE 4347, 295-305 (2001).
-
(2001)
Laser-Induced Damage in Optical Materials: 2000
, vol.4347
, pp. 295-305
-
-
Natoli, J.Y.1
Gallais, L.2
Akhouayri, H.3
Amra, C.4
-
5
-
-
0021597350
-
Spot size effects in laser damage testing
-
Natl. Bur. Stand. (U.S.) Spec. Publ
-
S. R. Foltyn, “Spot size effects in laser damage testing,” in Damage in Laser Materials, Natl. Bur. Stand. (U.S.) Spec. Publ. 669, 368-379 (1983).
-
(1983)
Damage in Laser Materials
, vol.669
, pp. 368-379
-
-
Foltyn, S.R.1
-
6
-
-
0020845426
-
Absolute onset of optical surface damage using distributed defect ensembles
-
J. O. Porteus and S. C. Seitel, “Absolute onset of optical surface damage using distributed defect ensembles,” Appl. Opt. 23, 3796-3805 (1984).
-
(1984)
Appl. Opt.
, vol.23
, pp. 3796-3805
-
-
Porteus, J.O.1
Seitel, S.C.2
-
7
-
-
0001522216
-
Onset threshold analysis of defect-driven surface and bulk laser damage
-
R. M. O’Connell, “Onset threshold analysis of defect-driven surface and bulk laser damage,” Appl. Opt. 31, 4143-4153 (1992).
-
(1992)
Appl. Opt.
, vol.31
, pp. 4143-4153
-
-
O’connell, R.M.1
-
8
-
-
0017504831
-
Statistical analysis of defect-caused damage in thin films
-
R. Picard, D. Milam, and R. Bradbury, “Statistical analysis of defect-caused damage in thin films,” Appl. Opt. 16, 1563-1571 (1977).
-
(1977)
Appl. Opt.
, vol.16
, pp. 1563-1571
-
-
Picard, R.1
Milam, D.2
Bradbury, R.3
-
9
-
-
0032635462
-
Extrapolation of damage test data to predict performance of large-area NIF optics at 355 nm
-
G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, andM. Soileau, eds., Proc. SPIE
-
M. D. Feit, A. M. Rubenchik, M. R. Kozlowski, F. Y. Genin, S. Schwartz, and L. M. Sheehan, “Extrapolation of damage test data to predict performance of large-area NIF optics at 355 nm,” in Laser-Induced Damage in Optical Materials: 1998, G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, andM. Soileau, eds., Proc. SPIE 3578, 226-234 (1999).
-
(1999)
Laser-Induced Damage in Optical Materials: 1998
, vol.3578
, pp. 226-234
-
-
Feit, M.D.1
Rubenchik, A.M.2
Kozlowski, M.R.3
Genin, F.Y.4
Schwartz, S.5
Sheehan, L.M.6
-
10
-
-
0032682141
-
Beam characterization: Application to the laser damage threshold
-
H. G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., SPIE
-
J. Hue, J. Dijon, P. Garrec, G. Ravel, L. Poupinet, and P. Lyan, “Beam characterization: application to the laser damage threshold,” in Laser-Induced Damage in Optical Materials: 1998, H. G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., SPIE 3578, 633-644 (1999).
-
(1999)
Laser-Induced Damage in Optical Materials: 1998
, vol.3578
, pp. 633-644
-
-
Hue, J.1
Dijon, J.2
Garrec, P.3
Ravel, G.4
Poupinet, L.5
Lyan, P.6
-
11
-
-
57849084440
-
R-on-1 automatic mapping: A new a tool for laser damage
-
A. Guenther, M. Kozlowski, B. New-nam, and M. Soileau, eds., Proc. SPIE
-
J. Hue, P. Garrec, J. Dijon, and P. Lyan, “.R-on-1 automatic mapping: a new a tool for laser damage,” in 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, A. Guenther, M. Kozlowski, B. New-nam, and M. Soileau, eds., Proc. SPIE 2714, 90-101 (1996).
-
(1996)
27Th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
, vol.2714
, pp. 90-101
-
-
Hue, J.1
Garrec, P.2
Dijon, J.3
Lyan, P.4
-
12
-
-
0031244801
-
Fatigue laser-induced damage in transparent materials
-
A. Chmel, “Fatigue laser-induced damage in transparent materials,” Mater. Sci. Engl. B 49, 175-190 (1997).
-
(1997)
Mater. Sci. Engl. B
, vol.49
, pp. 175-190
-
-
Chmel, A.1
-
13
-
-
0032644108
-
What is laser conditioning? A review focused on dielectric multilayers
-
G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE
-
H. Bercegol, “What is laser conditioning? A review focused on dielectric multilayers,” in Laser-Induced Damage in Optical Materials: 1998, G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE 3578, 421-426 (1999).
-
(1999)
Laser-Induced Damage in Optical Materials: 1998
, vol.3578
, pp. 421-426
-
-
Bercegol, H.1
-
14
-
-
0000932497
-
Laser conditionning of LaF3 MgF2 dielectric coatings at 248 nm
-
2dielectric coatings at 248 nm,” Appl. Opt. 35, 5613-5619 (1999).
-
(1999)
Appl. Opt.
, vol.35
, pp. 5613-5619
-
-
Eva, E.1
Mann, K.2
Kaiser, N.3
Anton, B.4
Henking, R.5
Ristau, D.6
Weissbrodt, P.7
Mademann, D.8
Raupach, L.9
Hacker, E.10
-
15
-
-
36749113679
-
Improving the bulk laser damage resistance of potassium dihydrogen phosphate by pulsed laser irradiation
-
J. Swain, S. Stokowski, D. Milam, and F. Rainer, “Improving the bulk laser damage resistance of potassium dihydrogen phosphate by pulsed laser irradiation,” Appl. Phys. Lett. 40, 350-352 (1982).
-
(1982)
Appl. Phys. Lett.
, vol.40
, pp. 350-352
-
-
Swain, J.1
Stokowski, S.2
Milam, D.3
Rainer, F.4
-
16
-
-
1942524628
-
Temporary laser damage thresh- old enhancement by laser conditioning of antireflection-coated glass
-
M. E. Frink, J. W. Arenberg, D. W. Mordaunt, S. C. Seitel, M. T. Babb, and E. A. Toppo, “Temporary laser damage thresh- old enhancement by laser conditioning of antireflection-coated glass,” Appl. Phys. Lett. 51, 415-417 (1987).
-
(1987)
Appl. Phys. Lett.
, vol.51
, pp. 415-417
-
-
Frink, M.E.1
Arenberg, J.W.2
Mordaunt, D.W.3
Seitel, S.C.4
Babb, M.T.5
Toppo, E.A.6
-
17
-
-
62149107779
-
“Correlation between He-Ne scatter an pulsed laser damage at coating defect
-
J. O. Porteus, C. J. Spiker, and J. B. Franck, “Correlation between He-Ne scatter an pulsed laser damage at coating defect, Appl. Opt. 25, 3871-3880 (1986).
-
(1986)
Appl. Opt
, vol.25
, pp. 3871-3880
-
-
Porteus, J.O.1
Spiker, C.J.2
Franck, J.B.3
-
18
-
-
0542370794
-
Light scattering from laser-damage speckled surfaces
-
P. S. Theocaris, “Light scattering from laser-damage speckled surfaces,” Appl. Opt. 36, 8775-8784 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 8775-8784
-
-
Theocaris, P.S.1
-
19
-
-
0001168250
-
Examination of laser damage sites of transparent surfaces and films using total internal reflection microscopy
-
Natl. Bur. Stand. (U.S.) Spec. Publ
-
P. A. Temple, “Examination of laser damage sites of transparent surfaces and films using total internal reflection microscopy,” in Laser-Induced Damage in Optical Materials, Natl. Bur. Stand. (U.S.) Spec. Publ. 568, 333-341 (1979).
-
(1979)
Laser-Induced Damage in Optical Materials
, vol.568
, pp. 333-341
-
-
Temple, P.A.1
-
20
-
-
0031289610
-
Application of total internal reflection microscopy for laser damage studies on fused silica
-
H. Bennett, A. Guenther, M. Kozlowski, B. Newnam, and M. Soileau, eds. Proc. SPIE
-
L. M. Sheehan, M. Kozlowski, and D. W. Camp, “Application of total internal reflection microscopy for laser damage studies on fused silica,” in Laser-Induced Damage in Optical Materials: 1997, H. Bennett, A. Guenther, M. Kozlowski, B. Newnam, and M. Soileau, eds. Proc. SPIE 3244, 282-295 (1998).
-
(1998)
Laser-Induced Damage in Optical Materials: 1997
, vol.3244
, pp. 282-295
-
-
Sheehan, L.M.1
Kozlowski, M.2
Camp, D.W.3
-
21
-
-
85010136588
-
Statistical distribution of laser damage and spatial scaling law for a model with multiple defects cooperation in damage
-
H. Bennett, A. Guenther, M. Kozlowski, B. Newnam, and M. Soileau, eds., Proc. SPIE
-
H. Bercegol, “Statistical distribution of laser damage and spatial scaling law for a model with multiple defects cooperation in damage,” in Laser-Induced Damage in Optical Materials: 1997, H. Bennett, A. Guenther, M. Kozlowski, B. Newnam, and M. Soileau, eds., Proc. SPIE 3244, 339-346 (1998).
-
(1998)
Laser-Induced Damage in Optical Materials: 1997
, vol.3244
, pp. 339-346
-
-
Bercegol, H.1
-
22
-
-
0000851767
-
Characterization of optical coating by photothermal deflection
-
M. Commandre and P. Roche, “Characterization of optical coating by photothermal deflection,” Appl. Opt. 35, 5021-5034 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 5021-5034
-
-
Commandre, M.1
Roche, P.2
-
23
-
-
5944239558
-
Photothermal characterization of optical thin film coatings
-
Z. Wu, M. Thomsen, P. Kuo, Y. Lu, C. Stolz, and M. Kozlowski, “Photothermal characterization of optical thin film coatings,” Opt. Eng. 36, 251-262 (1997).
-
(1997)
Opt. Eng.
, vol.36
, pp. 251-262
-
-
Wu, Z.1
Thomsen, M.2
Kuo, P.3
Lu, Y.4
Stolz, C.5
Kozlowski, M.6
-
24
-
-
84967871281
-
The surface morphology of as-deposited and laser-damaged dielectric mirror coating studied in situ by atomic force microscopy
-
G. S. Kino, ed., Proc. SPIE
-
M. Kozlowski, M. Staggs, M. Balooch, R. Tench, and W. Siekhaus, “The surface morphology of as-deposited and laser-damaged dielectric mirror coating studied in situ by atomic force microscopy,” in Scanning Microscopy Instrumentation, G. S. Kino, ed., Proc. SPIE 1556, 68-78 (1991).
-
(1991)
Scanning Microscopy Instrumentation
, vol.1556
, pp. 68-78
-
-
Kozlowski, M.1
Staggs, M.2
Balooch, M.3
Tench, R.4
Siekhaus, W.5
-
25
-
-
0032631164
-
Characterization of surface and subsurface defects in optical materials using near-field evanescent wave
-
H. Bennett, A. Guenther, M. Kozlowski, B. Newnam, and M. Soileau, eds., Proc. SPIE
-
M. Yan, S. Oberhelman, W. Siekhaus, Z. L. Wu, L. Sheehan, and M. Kozlowski, “Characterization of surface and subsurface defects in optical materials using near-field evanescent wave,” in Laser-Induced Damage in Optical Materials: 1998, H. Bennett, A. Guenther, M. Kozlowski, B. Newnam, and M. Soileau, eds., Proc. SPIE 3578, 718-720 (1999).
-
(1999)
Laser-Induced Damage in Optical Materials: 1998
, vol.3578
, pp. 718-720
-
-
Yan, M.1
Oberhelman, S.2
Siekhaus, W.3
Wu, Z.L.4
Sheehan, L.5
Kozlowski, M.6
-
26
-
-
0033885064
-
Laser-modulated scattering from optical surfaces using fiber detection
-
G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE
-
J. Y. Natoli, C. Deumie, and C. Amra, “Laser-modulated scattering from optical surfaces using fiber detection,” in Laser-Induced Damage in Optical Materials: 1999, G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE 3902, 128-137 (2000).
-
(2000)
Laser-Induced Damage in Optical Materials: 1999
, vol.3902
, pp. 128-137
-
-
Natoli, J.Y.1
Deumie, C.2
Amra, C.3
-
27
-
-
0000868329
-
Rear surface laser damage on 355-nm silica optics owing to Fresnel diffraction on front-surface contamination particule
-
F. Y. Genin, M. D. Feit, M. R. Kozlowski, A. M. Rubenchik, A. Salleo, and J. Yoshiyama, “Rear surface laser damage on 355-nm silica optics owing to Fresnel diffraction on front-surface contamination particule,” Appl. Opt. 39, 3654-3663 (2000).
-
(2000)
Appl. Opt.
, vol.39
, pp. 3654-3663
-
-
Genin, F.Y.1
Feit, M.D.2
Kozlowski, M.R.3
Rubenchik, A.M.4
Salleo, A.5
Yoshiyama, J.6
-
28
-
-
0027837092
-
Correlation of damage threshold and surface geometry of nodular defects in HR coating as determined by in-situ atomic force microscopy
-
1992, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, and M. Soileau, eds., Proc. SPIE
-
M. C. Staggs, M. R. Kozlowski, W. J. Sieklhaus, and M. Balooch, “Correlation of damage threshold and surface geometry of nodular defects in HR coating as determined by in-situ atomic force microscopy,” in Laser-Induced Damage in Optical Materials: 1992, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, and M. Soileau, eds., Proc. SPIE 1884, 234-242 (1993).
-
(1993)
Laser-Induced Damage in Optical Materials
, vol.1884
, pp. 234-242
-
-
Staggs, M.C.1
Kozlowski, M.R.2
Sieklhaus, W.J.3
Balooch, M.4
-
29
-
-
0031289950
-
Characterization of nodular and thermal defects in hafnia/silica multilayer coating using optical, photothermal, and atomic force microscopy
-
H. Bennett, A. Guenther, M. Koz-lowski, B. Newnam, and M. Soileau, eds., Proc. SPIE
-
C. J. Stolz, J. M. Yoshiyama, A. Salleo, Z. L. Wu, J. Green, and R. Krupka, “Characterization of nodular and thermal defects in hafnia/silica multilayer coating using optical, photothermal, and atomic force microscopy,” in Laser-Induced Damage in Optical Materials: 1997, H. Bennett, A. Guenther, M. Koz-lowski, B. Newnam, and M. Soileau, eds., Proc. SPIE 3244, 475-483 (1998).
-
(1998)
Laser-Induced Damage in Optical Materials: 1997
, vol.3244
, pp. 475-483
-
-
Stolz, C.J.1
Yoshiyama, J.M.2
Salleo, A.3
Wu, Z.L.4
Green, J.5
Krupka, R.6
-
30
-
-
0015614409
-
Role of cracks, pores, and absorbing inclusions on laser induced damage thresholds at surfaces of transparent dielectrics
-
N. Bloembergen, “Role of cracks, pores, and absorbing inclusions on laser induced damage thresholds at surfaces of transparent dielectrics,” Appl. Opt. 12, 661-664 (1973).
-
(1973)
Appl. Opt.
, vol.12
, pp. 661-664
-
-
Bloembergen, N.1
-
31
-
-
0037488487
-
Damage threshold prediction of hafnia-silica multiplayer coatings by nondestructive evaluation of fluence-limiting defects
-
Z. L. Wu, C. J. Stolz, S. C. Weakley, J. D. Hughes, and Q. Zhao, “Damage threshold prediction of hafnia-silica multiplayer coatings by nondestructive evaluation of fluence-limiting defects,” Appl. Opt. 40, 1897-1906 (2001).
-
(2001)
Appl. Opt.
, vol.40
, pp. 1897-1906
-
-
Wu, Z.L.1
Stolz, C.J.2
Weakley, S.C.3
Hughes, J.D.4
Zhao, Q.5
-
32
-
-
0033872393
-
One hundred joule per square centimeter 1.06 micron mirrors
-
G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE
-
J. Dijon, B. Raffin, C. Pelle, J. Hue, G. Ravel, and B. Andre, “One hundred joule per square centimeter 1.06 micron mirrors,” in Laser-Induced Damage in Optical Materials: 1999, G. Exarhos, A. Guenther, M. Kozlowski, K. Lewis, and M. Soileau, eds., Proc. SPIE 3902, 158-167 (2000).
-
(2000)
Laser-Induced Damage in Optical Materials: 1999
, vol.3902
, pp. 158-167
-
-
Dijon, J.1
Raffin, B.2
Pelle, C.3
Hue, J.4
Ravel, G.5
Andre, B.6
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