Localized laser damage test facility at LOSCM: Real time optical observation and quantitative AFM study

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3244, Issue , 1997, Pages 76-85

  Natoli, Jean Yves ^a   Volto, P ^a   Pommies, M ^a   Albrand, G ^a   Amra, C ^a  

^a Ecole Centrale Marseille   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAMERAS; CHARGE COUPLED DEVICES; CORRELATION METHODS; DEPOSITION; ELECTRON BEAMS; HIGH POWER LASERS; IMAGE QUALITY; LASER BEAM EFFECTS; NEODYMIUM LASERS; OPTICAL COATINGS; PULSED LASER APPLICATIONS;

REAL TIME MICROSCOPES;

LASER DAMAGE;

EID: 0031289980     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.306969     Document Type: Conference Paper

References (12)

1. Characterization of Optical Coatings by Photothermal Deflection
2. Multiscale roughness in optical multilayers: Atomic force microscopy and light scattering
3. Light-induced refractive-index modifications in dielectric thin films: Experimental determination of relaxation time and amplitude
4. Application of total internal reflection microscopy for laser damage studies on fused silica
5. Roughness induced absorption, scattering ellipsometry and mulidielectric resonances for laser damage investigation
6. Overcoat effect on laser-induced damage in optical coating
7. Effect of silica overlayers on laser damage of HfO2-SiO2 56° incidence high reflector
8. Damage morphology analysis of laser-induced surface cracks in fused silica at 355 nm
9. The surface morphology of As-deposited and laser-damaged dielectric mirror coating studied in situ by Atomic Force microscopy
10. Growth of laser-induced damage during repetitive illumination of HfO2-SiO2 multilayer mirror and polarizer coatings