Optimized metrology for laser-damage measurement: Application to multiparameter study

Applied Optics

Volumn 42, Issue 6, 2003, Pages 960-971

  Gallais, Laurent ^a   Natoli, Jean Yves ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE PROCESSING; MEASUREMENTS; OPTIMIZATION;

LASER-DAMAGE MEASUREMENT;

LASER DAMAGE;

EID: 0037455666     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.000960     Document Type: Article

References (39)

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