Characterization of optical coatings by photothermal deflection

Applied Optics

Volumn 35, Issue 25, 1996, Pages 5021-5034

  Commandré, Mireille ^a   Roche, Pierre ^a  

^a CNRS   (France)

Author keywords

Absorption; Calibration; Local defects; Optical coatings; Photothermal deflection

Indexed keywords

EID: 0000851767     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005021     Document Type: Article

References (45)

1. D. Ristau, X. C. Dang, and J. Ebert, “Interface and bulk absorption of oxyde layers and correlation to damage threshold at 1.064 pm, ” Nat. Bur. Stand. (U.S.) Spec. Publ. 727, 298-312 (1984).
2. M. Rahe, E. Oertel, L. Reinhardt, D. Ristau, and H. Welling, “Absorption calorimetry and laser induced damage threshold measurements of AR-coated ZnSe and metal mirrors at 10.6 μm, ” in Laser-Induced Damage in Optical Materials: 1990, H. E. Bennett, L. L. Chase, A. H. Guenther, B. Newman, and M. J. Soileau, eds., Proc. SPIE 1441, 113-126 (1990).
3. R. Chow, S. Falabella, G. E. Loomis, F. Rainer, C. J. Stolz, and M. R. Kozlowski, “Absorption and damage thresholds of low-defect-density hafnia deposited with activated oxygen, ” in Laser Induced Damage in Optical Materials: 1992, H. E. Bennett, L. L. Chase, A. H. Guenther, B. Newman, and M. J. Soileau, eds., Proc. SPIE 1848, 349-359 (1992).
4. M. R. Lange, J. K. Maclver, and A. H. Guenther, “Laser damage threshold predictions based on the effects of thermal and optical properties employing a spherical impurity model, ” Nat. Bur. Stand. (U.S.) Spec. Publ. 668, 454-465 (1983).
5. S. M. J. Akhtar, D. Ristau, and J. Ebert, “Thermal conductivity of dielectric films and correlation to damage thresholds at 1064 nm, ” Natl. Inst. Stand. Technol. Spec. Publ. 752, 345-351 (1986).
6. A. H. Guenther and J. K. MacIver, “The role of thermal conductivity in the pulsed laser damage sensitivity of optical thin films, ” Thin Solid Films 163, 203-214 (1988).
7. A. C. Boccara, D. Fournier, W. Jackson, and N. M. Amer, “Sensitive photothermal deflection technique for measuring absorption in optically thin media, ” Opt. Lett. 5, 377-379 (1980).
8. W. B. Jackson, N. M. Amer, A. C. Boccara, and D. Fournier, “Photothermal deflection spectroscopy and detection, ” Appl. Opt. 20, 1333-1344 (1981).
9. M. A. Olmstead, N. M. Amer, S. Kohn, D. Fournier, and A. C. Boccara, “Photothermal displacement spectroscopy: an opti cal probe for solids and surfaces, ” Appl. Phys. A 32, 141-154 (1983).
10. W. C. Mundy, R. S. Hughes, and C. K. Carniglia, “Photothermal deflection microscopy of dielectric thin films, ” Appl. Phys. Lett. 43, 985-987 (1983).
11. J. A. Abate, A. W. Schmid, M. J. Guardalben, D. J. Smith, and S. D. Jacobs, “Characterization of micron-sized defects by photothermal deflection spectroscopy, ” Nat. Bur. Stand. (U.S.) Spec. Publ. 688, 385-392 (1983).
12. M. Commandre, L. Bertrand, G. Albrand, and E. Pelletier, “Measurement of absorption losses of optical thin film components by photothermal deflection spectroscopy, ” in Optical Components and Systems, A. Masson, ed., Proc. SPIE 805, 128-135 (1987).
13. 2 films by a collinear photothermal deflection technique, ” Appl. Opt. 29, 4276-4283 (1990).
14. M. Commandre, P. Roche, G. Albrand, and E. Pelletier, “Photothermal deflection spectroscopy for the study of thin films and optical coatings: measurement of absorption losses and detection of photo-induced changes, ” in Optical Thin Films and Applications, R. Herrmann ed., Proc. SPIE 1270, 82-93 (1990).
15. S. E. Watkins, R. Heimlich, R. Reis, “Mapping of absorption in optical coatings, ” in Laser-Induced Damage in Optical Materials: 1991, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 1624, 246-255 (1991).
16. Z. L. Wu, M. Reichling, E. Welsch, D. Schafer, Z. X. Fan, and E. Matthias, “Defect characterisation for thin films through thermal wave detection, ” in Laser-Induced Damage in Optical Materials: 1991, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 1624, 271-281 (1991);
17. 2 single-layer films, ” Opt. Eng. 33, 1334-1342 (1994).
18. Z. L. Wu, M. Reichling, H. Gronbeck, Z. X. Fan, D. Schaefer, and E. Matthias, “Photothermal measurement of thermal conductivity of optical coatings, ” in Laser-Induced Damage in Op-tical Materials, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 1624, 331-345 (1991), and references therein;
19. M. Reichling and H. Gronbeck, “Harmonic heat flow in isotropic layered systems and its use for thin film thermal conductivity measurements, ” J. Appl. Phys. 75, 1914-1922 (1994).
20. M. Commandre, “Caractérisation de l’absorption dans les composants optiques en couches minces par deflexion photothermique, ” These de Doctorat d’Etat (Université d’Aix-Marseille, Marseille, 1992).
21. M. Commandre, P. Roche, J. P. Borgogno, and G. Albrand, “Surface contamination of bare substrates. Mapping of absorption and influence on deposited thin films, ” in Optical Interference Coatings, F. Abeles, ed., Proc. SPIE 2253, 982-992 (1994).
22. M. Commandre, P. Roche, J. P. Borgogno, and G. Albrand, “Absorption mapping for characterization of glass surfaces, ” Appl. Opt. 34, 2372-2379 (1995).
23. M. Commandre, P. Roche, J. P. Borgogno, and G. Albrand, “Effects of deposition conditions on thin film bulk and interface absorption, ” in Optical Interference Coatings, F. Abeles, ed., Proc. SPIE 2253, 1253-1262 (1994).
24. P. Roche, M. Commandre, R. Mollenhauer, and F. Flory, “Interpretation of measurements of both losses on guided propagation and absorption from a model of absorbing transition layers, ” in Optical Interference Coatings, F. Abeles, ed., Proc. SPIE 2253, 1286-1296 (1994).
25. C. Amra, M. Ranier, C. Grèzes-Besset, S. Maure, F. Cleva, R. Mollenhauer, and G. Albrand, “Loss anomalies in multilayer planar waveguides, ” in Optical Interference Coatings, F. Abeles, ed., Proc. SPIE 2253, 1005-1020 (1994).
26. E. Welsch, “Absorption measurements, ” in Thin Films for Optical Coatings, R. E. Hummel and K. H. Guenther, eds. (CRC, Boca Raton, Fla., 1995), Chap. 9, pp. 243-272 and references therein.
27. M. Commandre and P. Roche, “Characterisation of absorption by photothermal deflection, ” in Thin Films for Optical Systems, F. Flory, ed. (Dekker, New York, 1995), Chap. 12, pp. 329-365.
28. E. Abraham and J. M. Halley, “Some calculations of temperature profiles in thin films with laser heating, ” Appl. Phys. A 42, 279-285 (1987).
29. G. Rousset, F. Charbonnier, and F. Lepoutre, “Influence of radiative and convective transfers in a photothermal experiment, ” J. Appl. Phys. 56, 2093-2096 (1984).
30. F. Flory, H. Rigneault, N. N. Maythaveekulchai, and F. Zamkotsian, “Characterization by guided wave of instabilities of optical coatings submitted to high-power flux: thermal and third-order nonlinear properties of dielectric thin films, ” Appl. Opt. 32, 28, 5628-5639 (1993).
31. J. Opsal, A. Rosencwaig, and D. L. Willenborg, “Thermal wave detection and thin film thickness measurements with laser beam deflection, ” Appl. Opt. 22, 3169-3176 (1983).
32. D. Ristau and J. Ebert, “Development of a thermographic laser calorimeter, ” Appl. Opt. 25, 4571-4578 (1986).
33. D. L. Decker, L. G. Koshigoe, and E. J. Ashley, “Thermal properties of optical thin film materials, ” Nat. Bur. Stand. Spec. Publ. 727, 291-297 (1984).
34. J. C. Lambropoulos, M. R. Joly, C. A. Amsden, S. E. Gilman, M. J. Sinicropi, D. Diakomihalis, and S. D. Jacobs, “Thermal conductivity of dielectric thin films, ” J. Appl. Phys. 66, 4230-4242 (1989).
35. V. Scheuer, C. Schuchert, and T. Tschudi, “The influence of small amounts of impurities in sputtered laser mirrors on their performance, ” in Thin Films in Optics, T. T. Tschudi, ed., Proc. SPIE 1125, 54-60 (1990).
36. P. Roche and E. Pelletier, “Characterisation of optical surfaces by measurement of scattering distribution, ” Appl. Opt. 23, 3561-3566 (1984).
37. P. A. Temple, “Examination of laser damage sites of transparent surfaces and films using total internal reflection microscopy, ” in Laser Induced Damage in Optical Materials: 1979, Nat. Bur. Stand. Spec. Publ. 568, 333-341 (1979).
38. F. L. Williams, C. K. Carniglia, B. J. Pond, and W. K. Stowell, “Investigation of thin films using total internal reflection microscopy, ” in Laser Induced Damage in Optical Materials: 1989, Nat. Inst. Stand. Technol. Spec. Publ. 801, 299-308 (1989).
39. R. C. Estier, N. S. Nogar, and R. A. Schmell, “The detection, removal and effect on damage thresholds of cerium impurities on fused silica, ” in Laser Induced Damage in Optical Materials: 1988, Nat. Inst. Stand. Technol. Spec. Publ. 775, 183-188 (1988).
40. T. Raj, D. E. McCready, and C. K. Carniglia, “Substrate cleaning in vacuum by laser irradiation, ” in Laser Induced Damage in Optical Materials: 1988, Nat. Inst. Stand. Technol. Spec. Publ. 775, 152-165 (1988).
41. R. S. Hockett, “Quantitative analysis of surface trace metal contamination on substrates and films by TXRF, ” in Laser Induced Damage in Optical Materials: 1989, Nat. Inst. Stand. Technol. Spec. Publ. 801, 239-253 (1989).
42. H. K. Pulker, “Nature of a surface, ” in Coating on Glass (Elsevier, New York, 1984), Chap 3, pp. 34-42.
43. T. S. Izumitani, Optical Glass, American Institute of Physics Translation Series (American Institute of Physics, New York, 1986), Chap. 2, pp. 15-55.
44. K. Kinosita, “Surface deterioration of optical glasses, ” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1965), Vol. 4, pp. 85-143.
45. P. Roche, M. Commandre, L. Escoubas, J. P. Borgogno, G. Albrand, and B. Lazarides, “Substrate effects on absorption of coated surfaces, ” Appl. Opt. 35, 5059-5066 (1996).