Facets, indium distribution, and lattice distortion of InGaAs/GaAs quantum dots observed by three-dimensional scanning transmission electron microscope

Journal of Applied Physics

Volumn 94, Issue 1, 2003, Pages 313-317

  Ozasa, Kazunari ^a   Aoyagi, Yoshinobu ^a   Iwaki, Masaya ^a   Kurata, Hiroki ^b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COALESCENCE; RELAXATION PROCESSES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE;

LATTICE DISTORTION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0041840542     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1572976     Document Type: Article

References (28)

1. L. Roy, Appl. Phys. Lett. 79, 3912 (2001).
2. K. Ozasa, S. Nomura, and Y. Aoyagi, Superlattices Microstruct. 30, 169 (2001).
3. S. Kako, T. Sugimoto, Y. Toda, S. Ishida, A. Nishioka, and Y. Arakawa, Physica A 13, 151 (2002).
4. J. Urayama, TB. Norris, H. Jiang, J. Singh, and P. Bhattacharya, Appl. Phys. Lett. 80, 2162 (2002).
5. K. M. Kim, Y. J. Park, Y. M. Park, C. K. Hyon, E. K. Kim, and J. H. Park, J. Appl. Phys. 92, 5453 (2002).
6. U. Woggon, W. Langbein, J. M. Hvam, A. Rosenauer, T. Remmele, and D. Gerthsen, Appl. Phys. Lett. 71, 377 (1997).
7. S. Kret, T. Benabbas, C. Delamarre, Y. Androussi, A. Dubon, J. Y. Laval, and A. Lefebvre, J. Appl. Phys. 86, 1988 (1999).
8. N. Liu, J. Tersoff, O. Baklenov, A. L. Holmes, and C. K. Shih, Phys. Rev. Lett. 84, 334 (2000).
9. M. D. Giorgi, A. Passaseo, R. Rinaldi, T. Johal, R. Cingolani, A. Taurino, M. Catalano, and P. Crozier, Phys. Status Solidi B 224, 17 (2001).
10. D. M. Bruls, J. W. A. M. Vugs, P. M. Koenraad, H. W. M. Salemink, J. H. Wolter, M. Hopkinson, M. S. Skolnick, F. Long, and S. P. A. Gill, Appl. Phys. Lett. 81, 1708 (2002).
11. J. Y. Lavai, S. Kret, C. Delamarre, P. Bassoul, T. Benabbas, and Y. Androussi, Microsc. Microanal. 8, 312 (2002).
12. M. Ishii, K. Ozasa, and Y. Aoyagi, Microelectron. Eng. (to be published).
13. K. Georgsson, N. Carlsson, L. Samuelson, W. Seifert, and L. R. Wallenberg, Appl. Phys. Lett. 67, 2981 (1995).
14. S. Ruvimov and K. Scheerschmidt, Phys. Status Solidi A 150, 471 (1995).
15. M. Grundmann, R. Heitz, N. Ledentsov, O. Stier, D. Bimberg, VM. Ustinov, PS. Kop'ev, Zhl. Alferov, SS. Ruvimov, P. Werner, U. Gosele, and J. Heydenreich, Superlattices Microstruct. 19, 81 (1996).
16. F. Houzay, C. Guille, J. M. Moison, P. Henoc, and F. Barthe, J. Cryst. Growth 81, 67 (1987).
17. S. Guha, A. Madhukar, and K. C. Rajkumar, Appl. Phys. Lett. 57, 2110 (1990).
18. Y. Nabetani, A. Wakahara, and A. Sakaki, J. Appl. Phys. 78, 6461 (1995).
19. Y. Chen, X. W. Lin, Z. L. Weber, J. Washburn, J. F. Klem, and J. Y. Tsao, Appl. Phys. Lett. 68, 111 (1996).
20. K. Shiramine, Y. Horisaki, D. Suzuki, S. Itoh, Y. Ebiko, S. Muto, Y. Nakata, and N. Yokoyama, Jpn. J. Appl. Phys., Part 1 37, 5493 (1998).
21. M. Koguchi, H. Kakibayashi, R. Tsuneta, M. Yamaoka, T. Niino, N. Tanaka, K. Kase, and M. Iwaki, J. Electron Microsc. 50, 235 (2001).
22. K. Ozasa, Y. Aoyagi, and M. Iwaki, J. Mater. Sci. Lett. (in press).
23. K. Ozasa and Y. Aoyagi, J. Cryst. Growth 188, 370 (1998).
24. K. Ozasa, S. Nomura, M. Takeuchi, and Y. Aoyagi, Mater. Sci. Eng., B 86, 34 (2001).
25. A. J. DeMarco and J. Melngailis, J. Vac. Sci. Technol. B 19, 2543 (2001).
26. K. Ozasa, Y. Aoyagi, and M. Iwaki (unpublished).
27. P. Werner, K. Scheerschmidt, N. D. Zakharov, R. Hillebrand, M. Grundmann, and R. Schneider, Cryst. Res. Technol. 35, 759 (2000).
28. A. Krost, F. Heinrichsdorff, D. Bimberg, J. Biasing, A. Darhuber, and G. Bauer, Cryst. Res. Technol. 34, 89 (1999).