Growth of oriented gallium nitride films on amorphous substrates by self assembly

Materials Research Society Symposium - Proceedings

Volumn 743, Issue , 2002, Pages 103-108

  Li, Hongwei ^a   Sunkara, Mahendra K ^a  

^a University of Louisville ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL ORIENTATION; ELECTRON CYCLOTRON RESONANCE; NANOSTRUCTURED MATERIALS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SEMICONDUCTOR GROWTH; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

FULL WIDTH AT HALF MAXIMUM; MICRO-RAMAN SPECTRA; SEMICONDUCTING GALLIUM NITRIDE;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0038455516     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-743-l3.11     Document Type: Conference Paper

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