메뉴 건너뛰기




Volumn 104, Issue 3, 2003, Pages 236-245

Applications of a low contact force polyimide shank bolometer probe for chemical and biological diagnostics

Author keywords

Bolometer; Chemical diagnostics; Polyimide shank

Indexed keywords

BIOCHEMISTRY; CELLS; DIFFUSION; MICROMACHINING; PHOTORESISTS; POLYIMIDES; PROBES; SUBSTRATES; TUMORS;

EID: 0037716784     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(03)00026-8     Document Type: Article
Times cited : (25)

References (30)
  • 2
    • 5544277233 scopus 로고    scopus 로고
    • Scanning thermal microscopy: Subsurface imaging, thermal mapping of polymer blends, and localized calorimetry
    • A. Hammiche, D.J. Hourston, H.M. Pollock, M. Reading, M. Song, Scanning thermal microscopy: subsurface imaging, thermal mapping of polymer blends, and localized calorimetry, J. Vac. Sci. Technol. B 14 (2) (1996) 1486-1491.
    • (1996) J. Vac. Sci. Technol. B , vol.14 , Issue.2 , pp. 1486-1491
    • Hammiche, A.1    Hourston, D.J.2    Pollock, H.M.3    Reading, M.4    Song, M.5
  • 4
    • 0033301083 scopus 로고    scopus 로고
    • Scanning thermal microscopy
    • A. Majumdar, Scanning thermal microscopy, Annu. Rev. Mater. Sci. 29 (1999) 505-585.
    • (1999) Annu. Rev. Mater. Sci. , vol.29 , pp. 505-585
    • Majumdar, A.1
  • 5
    • 0030106201 scopus 로고    scopus 로고
    • Novel microcantilever for scanning thermal imaging microscopy
    • Y. Suzuki, Novel microcantilever for scanning thermal imaging microscopy, Jpn. J. Appl. Phys. Part 2 35 (3A) (1996) L352-L354.
    • (1996) Jpn. J. Appl. Phys. Part 2 , vol.35 , Issue.3 A
    • Suzuki, Y.1
  • 6
    • 0031275324 scopus 로고    scopus 로고
    • A silicon micromachined scanning thermal profiler with integrated elements for sensing and actuation
    • Y.B. Gianchandani, K. Najafi, A silicon micromachined scanning thermal profiler with integrated elements for sensing and actuation, IEEE Trans. Electron Dev. 44 (11) (1997) 1857-1867.
    • (1997) IEEE Trans. Electron Dev. , vol.44 , Issue.11 , pp. 1857-1867
    • Gianchandani, Y.B.1    Najafi, K.2
  • 7
    • 67649972063 scopus 로고    scopus 로고
    • Micromachined fabrication of Si cantilevers with Schottky diodes integrated in the tip
    • T. Leinhos, M. Stopka, E. Oesterschulze, Micromachined fabrication of Si cantilevers with Schottky diodes integrated in the tip, Appl. Phys. A 66 (1998) S65-S69.
    • (1998) Appl. Phys. A , vol.66
    • Leinhos, T.1    Stopka, M.2    Oesterschulze, E.3
  • 8
    • 0034316437 scopus 로고    scopus 로고
    • Microcalorimetry applications of a surface micromachined bolometer-type thermal probe
    • M.-H. Li, Y.B. Gianchandani, Microcalorimetry applications of a surface micromachined bolometer-type thermal probe, J. Vac. Sci. Technol. B 18 (6) (2000) 3600-3603.
    • (2000) J. Vac. Sci. Technol. B , vol.18 , Issue.6 , pp. 3600-3603
    • Li, M.-H.1    Gianchandani, Y.B.2
  • 9
    • 0035279275 scopus 로고    scopus 로고
    • Surface micromachined polyimide scanning thermocouple probes
    • M.-H. Li, J.J. Wu, Y.B. Gianchandani, Surface micromachined polyimide scanning thermocouple probes, J. Microelectromech. Syst. 10 (1) (2001) 3-9.
    • (2001) J. Microelectromech. Syst. , vol.10 , Issue.1 , pp. 3-9
    • Li, M.-H.1    Wu, J.J.2    Gianchandani, Y.B.3
  • 11
    • 0035440479 scopus 로고    scopus 로고
    • Design and batch fabrication of probes for sub-100 nm scanning thermal microscopy
    • L. Shi, O. Kwon, A.C. Miner, A. Majumdar, Design and batch fabrication of probes for sub-100 nm scanning thermal microscopy, J. Microelectromech. Syst. 10 (3) (2001) 370-378.
    • (2001) J. Microelectromech. Syst. , vol.10 , Issue.3 , pp. 370-378
    • Shi, L.1    Kwon, O.2    Miner, A.C.3    Majumdar, A.4
  • 13
    • 0034702673 scopus 로고    scopus 로고
    • Thermal probe measurements of the glass transition temperature for ultrathin polymer films as a function of thickness
    • D. Fryer, P. Nealey, J. de Pablo, Thermal probe measurements of the glass transition temperature for ultrathin polymer films as a function of thickness, Macromolecules 33 (17) (2000) 6439-6447.
    • (2000) Macromolecules , vol.33 , Issue.17 , pp. 6439-6447
    • Fryer, D.1    Nealey, P.2    De Pablo, J.3
  • 14
    • 0001558497 scopus 로고    scopus 로고
    • Latent image formation: Nano-scale topography and calorimetric measurements in chemical amplified resists
    • L.E. Ocola, D. Fryer, P. Nealey, J. dePablo, F. Cerrina, S. Kämmer, Latent image formation: nano-scale topography and calorimetric measurements in chemical amplified resists, J. Vac. Sci. Technol. B 14 (6) (1996) 3974-3999.
    • (1996) J. Vac. Sci. Technol. B , vol.14 , Issue.6 , pp. 3974-3999
    • Ocola, L.E.1    Fryer, D.2    Nealey, P.3    Depablo, J.4    Cerrina, F.5    Kämmer, S.6
  • 15
    • 85031163178 scopus 로고    scopus 로고
    • TM Microscopes; Probe Model no. 1615-00
    • TM Microscopes, http://www.tmmicro.com. Probe Model no. 1615-00.
  • 16
    • 0029429850 scopus 로고
    • Equilibrium of hinged and hingeless structures rotated using surface tension forces
    • R.R.A. Syms, Equilibrium of hinged and hingeless structures rotated using surface tension forces, J. Microelectromech. Syst. 4 (4) (1995) 177-184.
    • (1995) J. Microelectromech. Syst. , vol.4 , Issue.4 , pp. 177-184
    • Syms, R.R.A.1
  • 17
    • 0000383256 scopus 로고
    • Low temperature thermal oxidation sharpening of microcast tips
    • S. Akamine, C.F. Quate, Low temperature thermal oxidation sharpening of microcast tips, J. Vac. Sci. Technol. B 10 (5) (1992) 2307-2310.
    • (1992) J. Vac. Sci. Technol. B , vol.10 , Issue.5 , pp. 2307-2310
    • Akamine, S.1    Quate, C.F.2
  • 18
    • 21544477786 scopus 로고    scopus 로고
    • Determination of the thermal conductivity of diamond-like nanocomposite films using a scanning thermal microscope
    • F. Ruiz, W.D. Sun, F.H. Pollak, C. Venkatraman, Determination of the thermal conductivity of diamond-like nanocomposite films using a scanning thermal microscope, Appl. Phys. Lett. 73 (13) (1998) 1802-1804.
    • (1998) Appl. Phys. Lett. , vol.73 , Issue.13 , pp. 1802-1804
    • Ruiz, F.1    Sun, W.D.2    Pollak, F.H.3    Venkatraman, C.4
  • 19
    • 0001101439 scopus 로고    scopus 로고
    • Thermal conductivity of fully and partially coalesced lateral epitaxial overgrown GaN/sapphire (0001) by scanning thermal microscopy
    • D.I. Florescu, V.M. Asnin, F.H. Pollak, A.M. Jones, J.C. Ramer, M.J. Schurman, I. Ferguson, Thermal conductivity of fully and partially coalesced lateral epitaxial overgrown GaN/sapphire (0001) by scanning thermal microscopy, Appl. Phys. Lett. 77 (10) (2000) 1464-1466.
    • (2000) Appl. Phys. Lett. , vol.77 , Issue.10 , pp. 1464-1466
    • Florescu, D.I.1    Asnin, V.M.2    Pollak, F.H.3    Jones, A.M.4    Ramer, J.C.5    Schurman, M.J.6    Ferguson, I.7
  • 20
    • 36449007442 scopus 로고
    • Calibration of atomic-force microscope tips
    • J.L. Hutter, J. Bechhoefer, Calibration of atomic-force microscope tips, Rev. Sci. Instrum. 64 (7) (1993) 1868-1873.
    • (1993) Rev. Sci. Instrum. , vol.64 , Issue.7 , pp. 1868-1873
    • Hutter, J.L.1    Bechhoefer, J.2
  • 23
    • 34347209835 scopus 로고
    • Calculation of thermal noise in atomic-force microscopy
    • H.-J. Butt, M. Jaschke, Calculation of thermal noise in atomic-force microscopy, Nanotechnology 6 (1995) 1-7.
    • (1995) Nanotechnology , vol.6 , pp. 1-7
    • Butt, H.-J.1    Jaschke, M.2
  • 25
    • 0032670585 scopus 로고    scopus 로고
    • Chemically amplified resists: Past, present, and future
    • H. Ito, Chemically amplified resists: past, present, and future, SPIE 3678 (1999) 2-12.
    • (1999) SPIE , vol.3678 , pp. 2-12
    • Ito, H.1
  • 26
    • 0032633614 scopus 로고    scopus 로고
    • The accuracy of current model descriptions of a DUV photoresist
    • D. Kang, E.K. Pavelchek, C. Swible-Keane, The accuracy of current model descriptions of a DUV photoresist, SPIE 3678 (1999) 877-890.
    • (1999) SPIE , vol.3678 , pp. 877-890
    • Kang, D.1    Pavelchek, E.K.2    Swible-Keane, C.3
  • 27
    • 0000572729 scopus 로고
    • Acid-diffusion effect on nanofabrication in chemical amplification resist
    • T. Yoshimura, T. Nakayama, S. Okazaki, Acid-diffusion effect on nanofabrication in chemical amplification resist, J. Vac. Sci. Technol. B 10 (6) (1992) 2615-2619.
    • (1992) J. Vac. Sci. Technol. B , vol.10 , Issue.6 , pp. 2615-2619
    • Yoshimura, T.1    Nakayama, T.2    Okazaki, S.3
  • 29
    • 0000752766 scopus 로고
    • Effect of acid diffusion on performance in positive deep ultraviolet resists
    • T.H. Fedynyshyn, J.W. Thackery, J.H. Georger, M.D. Denison, Effect of acid diffusion on performance in positive deep ultraviolet resists, J. Vac. Sci. Technol. B 12 (6) (1994) 3888-3894.
    • (1994) J. Vac. Sci. Technol. B , vol.12 , Issue.6 , pp. 3888-3894
    • Fedynyshyn, T.H.1    Thackery, J.W.2    Georger, J.H.3    Denison, M.D.4
  • 30
    • 0021357663 scopus 로고
    • Histone protein and DNA synthesis in HeLa cells after thermal shock
    • R.L. Warters, O.L. Stone, Histone protein and DNA synthesis in HeLa cells after thermal shock, J. Cell. Phys. 118 (1984) 153-160.
    • (1984) J. Cell. Phys. , vol.118 , pp. 153-160
    • Warters, R.L.1    Stone, O.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.