SCOPUS 정보 검색 플랫폼

Volumn 22, Issue 11, 2001, Pages 829-834

Three-dimensional information on the phase domain structure of thin films of polymer blends revealed by secondary ion mass spectrometry

(6) Bernasik, Andrzej a Rysz, Jakub a Budkowski, Andrzej a Kowalski, Kazimierz a Camra, Józef a Jedliński, Jerzy a

a JAGIELLONIAN UNIVERSITY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

DEUTERIUM; POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; MASS SPECTROMETRY; PHASE SEPARATION; POLYMERIZATION;

EID: 0035535622 PISSN: 10221336 EISSN: None Source Type: Journal
DOI: 10.1002/1521-3927(20010701)22:11<829::AID-MARC829>3.0.CO;2-8 Document Type: Article

Times cited : (42)

References (28)

1
- 0029134299
- (1995) Mater. Sci. Eng. , vol.R14 , pp. 1
- Krausch, G.¹

2
- 0002408269
- (1999) Adv. Polym. Sci. , vol.138 , pp. 1
- Binder, K.¹

3
- 20444423871
- (1999) Adv. Polym. Sci. , vol.148 , pp. 1
- Budkowski, A.¹

4
- 0032568107
- and references cited therein
- (1998) Nature , vol.31 , pp. 877
- Böltau, M.¹ Walheim, S.² Mlynek, J.³ Krausch, G.⁴ Steiner, U.⁵

5
- 0040799916
- (1999) Science , vol.283 , pp. 520
- Walheim, S.¹ Schäffer, E.² Mlynek, J.³ Steiner, U.⁴

6
- 0030562923
- (1996) Physica B , vol.221 , pp. 267
- Russell, T.P.¹

7
- 0026202620
- and references cited therein
- (1991) Physica B , vol.174 , pp. 189
- Kramer, E.J.¹

8
- 0031371979
- (1997) Acta Polym. , vol.48 , pp. 548
- Kerle, T.¹ Scheffold, F.² Losch, A.³ Steiner, U.⁴ Schatz, G.⁵ Klein, J.⁶

9
- 0024682594
- (1989) Macromolecules , vol.22 , pp. 2581
- Coulon, G.¹ Russell, T.P.² Deline, V.R.³ Green, P.F.⁴

10
- 0024683952
- (1989) Macromolecules , vol.22 , pp. 2648
- Whithlow, S.J.¹ Wool, R.P.²

11
- 0000024010
- (1992) Mol. Phys. , vol.76 , pp. 937
- Schwarz, S.A.¹ Wilkens, B.J.² Pudensi, M.A.A.³ Rafailovich, M.H.⁴ Sokolov, J.⁵ Zhao, X.⁶ Zhao, W.⁷ Zheng, X.⁸ Russell, T.P.⁹ Jones, R.A.L.¹⁰

12
- 0002115733
- Segregation and separation processes in thin polymer films studied by SIMS
- I. Olefjord, L. Nyborg, D. Bryggs, Eds., John Wiley & Sons New York
- (1997) ECASIA 97
- Bernasik, A.¹ Rysz, J.² Budkowski, A.³ Kowalski, K.⁴ Camra, J.⁵ Jedlinski, J.⁶

13
- 0034164121
- (2000) Europhys. Lett. , vol.50 , pp. 35
- Rysz, J.¹ Budkowski, A.² Bernasik, A.³ Klein, J.⁴ Kowalski, K.⁵ Jedlinski, J.⁶ Fetters, L.J.⁷

14
- 0031505824
- (1997) Europhys. Lett. , vol.40 , pp. 503
- Rysz, J.¹ Bernasik, A.² Ermer, H.³ Budkowski, A.⁴ Brenn, R.⁵ Hashimoto, T.⁶ Jedlinski, J.⁷

15
- 0003828435
- John Wiley & Sons, Salle + Sauerländer, Frankfurt am Maín
- (1992) nd ed. , vol.2
- Briggs, D.¹ Seah, M.P.²

16
- 0003708013
- Cambridge University Press, Cambridge, and references cited therein
- (1998) st ed.
- Briggs, D.¹

17
- 21144466360
- (1992) J. Vac. Sci. Technol. A , vol.10 , pp. 2679
- Gray, K.H.¹ Gould, S.² Leasure, R.M.³ Musselman, I.H.⁴ Lee, J.J.⁵ Meyer, T.J.⁶ Liton, R.W.⁷

18
- 0000519287
- (1995) Int. J. Mass Spectr. Ion Proc. , vol.143 , pp. 191
- Chabala, J.M.¹ Soni, K.K.² Li, J.³ Gavrilov, K.L.⁴ Levi-Setti, R.⁵

19
- 0001480275
- (1999) Appl. Phys. Lett. , vol.75 , pp. 3414
- Dunn, D.N.¹ Hull, R.²

20
- 21844524385
- (1995) Europhys. Lett. , vol.29 , pp. 353
- Straub, W.¹ Bruder, F.² Brenn, R.³ Krausch, G.⁴ Bielefeldt, H.⁵ Kirsch, A.⁶ Marti, O.⁷ Mlynek, J.⁸ Marko, J.F.⁹

21
- 0033556982
- (1999) Europhys. Lett. , vol.45 , pp. 526
- Ade, H.¹ Winesett, D.A.² Smith, A.P.³ Qu, S.⁴ Ge, S.⁵ Sokolov, J.⁶ Rafailovich, M.⁷

22
- 0032625109
- (1999) Macromolecules , vol.32 , pp. 3758
- Heier, J.¹ Kramer, E.J.² Revesz, P.³ Battistig, G.⁴ Bates, F.S.⁵

23
- 0032135901
- (1998) Langmuir , vol.14 , pp. 4860
- Slep, D.¹ Asselta, J.² Rafailovich, M.H.³ Sokolov, J.⁴ Winesett, D.A.⁵ Smith, A.P.⁶ Ade, H.⁷ Strzhemechny, Y.⁸ Schwarz, S.A.⁹ Sauer, B.B.¹⁰

24
- 0035797039
- (2001) Vacuum , vol.63 , pp. 307
- Cyganik, P.¹ Bernasik, A.² Budkowski, A.³ Bergues, B.⁴ Kowalski, K.⁵ Rysz, J.⁶ Lekki, J.⁷ Lekka, M.⁸ Postawa, Z.⁹

25
- 0035796929
- (2001) Vacuum , vol.63 , pp. 297
- Bergues, B.¹ Lekki, J.² Budkowski, A.³ Cyganik, P.⁴ Lekka, M.⁵ Bernasik, A.⁶ Rysz, J.⁷ Postawa, Z.⁸

26
- 0032083714
- and references therein
- (1998) Microelectron. Reliab. , vol.38 , pp. 869
- Verkleij, D.¹

27
- 0031147181
- (1997) Physica A , vol.239 , pp. 87
- Dalnoki-Veress, K.¹ Forrest, J.A.² Stevens, J.R.³ Dutcher, J.R.⁴

28
- 0032613856
- (1999) Phys. Rev. Lett. , vol.82 , pp. 2602
- Rockford, L.¹ Liu, Y.² Mansky, P.³ Russell, T.P.⁴ Yoon, M.⁵ Mochrie, S.G.J.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.