Depth profiling studies of the surface directed phase decomposition in thin polymer films

Vacuum

Volumn 54, Issue 1-4, 1999, Pages 303-307

  Rysz, J ^a   Ermer, H ^d   Budkowski, A ^a   Lekka, M ^b   Bernasik, A ^a,c   Wrobel S ^a   Brenn, R ^d   Lekki, J ^b   Jedlinski J ^a,c  

^a JAGIELLONIAN UNIVERSITY   (Poland)

^b INSTITUTE OF NUCLEAR PHYSICS   (Poland)

^c AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINARY MIXTURES; BLOCK COPOLYMERS; COMPOSITION; DECOMPOSITION; MORPHOLOGY; OPTICAL MICROSCOPY; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SUBSTRATES; SURFACE TREATMENT; SURFACES;

COMPOSITION DEPTH PROFILING TECHNIQUES; FINITE FILM THICKNESS; LAMINATED STRUCTURES; LATERAL MORPHOLOGY; NUCLEAR REACTION ANALYSIS; PHASE DECOMPOSITION; POLYMER MIXTURES; SURFACE ACTIVE DIBLOCK COPOLYMERS; SURFACE MODE;

THIN FILMS;

EID: 0033154309     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(98)00483-7     Document Type: Article

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