Nanophase-separated polymer films as high-performance antireflection coatings

Science

Volumn 283, Issue 5401, 1999, Pages 520-522

  Walheim, Stefan ^a   Schäffer, Erik ^a   Mlynek, Jürgen ^a   Steiner, Ullrich ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT TRANSMISSION; NANOSTRUCTURED MATERIALS; ORGANIC POLYMERS; PHASE SEPARATION; PLASTIC FILMS; POROSITY; REFRACTIVE INDEX;

MACROMOLECULAR LIQUID; OPTICAL SURFACES;

ANTIREFLECTION COATINGS;

NANOPARTICLE; POLYMER;

ARTICLE; DEVICE; MACROMOLECULE; OPTICAL DENSITY; PRIORITY JOURNAL; REFRACTION INDEX; SURFACE PROPERTY;

EID: 0040799916     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.283.5401.520     Document Type: Article

References (16)

1. H. A. Macleod, Thin-Film Optical Filters (Hilger, Bristol, UK, 1986).
2. M. J. Minot, J. Opt. Soc. Am. 66, 515 (1976).
3. D. R. Uhlmann, T. Suratwala, K. Davidson, J. M. Boulton, G. Teowee, J. Non-Cryst. Solids 218, 113 (1997).
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6. S. Walheim, M. Böltau, J. Mlynek, G. Krausch, U. Steiner, Macromolecules 30, 4995 (1997).
7. M. Böltau, S. Walheim, J. Mlynek, G. Krausch, U. Steiner, Nature 391, 877 (1998).
8. A patent application for this method was filed with the German Patent Office on 26 June 1998 under number 198 29 172.8.
9. Nanoporous films based on a PS-polyvinylchloride mixture show practically identical results (S. Walheim and U. Steiner, unpublished material).
10. All polymers were purchased from Polymer Standards Service in Mainz and were used as obtained. Polymer polydispersities were 1.1 and lower. As solvents, analytic grade THF [stabilized with 2.6-di-tert-butyl-4-methylphenol (250 mg/liter)], cyclohexane, and ethanol were used. Standard microscope glass slides 1 mm thick were used as substrates.
11. Atomic force microscopy measurements were carried out on a self-built AFM. Layer thicknesses and refractive indices were measured with a single-wavelength (λ = 632.8 nm) ellipsometer (Riss Ellipsometerbau, model EL X-1). For the ellipsometry measurements, polished silicon wafers were used as substrates. Light transmission spectra were measured with a Perkin Elmers Lambda 40 spectrometer at vertical incidence with an open reference beam.
12. w = 10.6, kg/mol) (70:30% w/w) in THF (2% polymer by weight) was used. In both cases, the PS phase was removed by exposing the sample for 1 min to cyclohexane.
13. 2.
14. w = 54(PS)-54(PMMA) kg/mol] (57.5:37.5:5% w/w/w) in THF (2% polymer by weight) was used. The sample was exposed for 30 s to cyclohexane to remove the PS phase.
15. M. Templin et al., Science 278, 1795 (1997).
16. Supported by the Deutsche Forschungsgesellschaft (DFG) (grant SFB 513. B2). U.S. acknowledges financial support by a research fellowship (Habilitations-Stipendum) of the DFG. We thank S. Eggert and T. P. Russell for useful discussions, H.-J. Apell for the use of his spectrometer, R. Adams for his help with the manuscript, and R. Müller for his help with the experiments.