Topography and surface composition of thin films of blends of polystyrene with brominated polystyrenes: Effects of varying the degree of bromination and annealing

Macromolecules

Volumn 31, Issue 18, 1998, Pages 6280-6288

  Affrossman, Stanley ^a   O'Neill, Scott A ^a   Stamm, Manfred ^b  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; INTERFACES (MATERIALS); PLASTIC FILMS; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SILICON WAFERS; SURFACE TOPOGRAPHY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

BROMINATION;

POLYMER BLENDS;

EID: 0032497210     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma971676q     Document Type: Article

References (6)

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5. Wilhelm, T.; Hofman, R.; Fuhrmann, J. Makromol. Chem. Rapid Commun. 1983, 4, 81.
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