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Volumn 18, Issue 3, 2003, Pages

Exceptionally high voltage Schottky diamond diodes and low boron doping

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL IMPURITIES; DIAMOND FILMS; ELECTRIC POTENTIAL; ENERGY GAP; EPITAXIAL GROWTH; SEMICONDUCTING BORON; SEMICONDUCTING DIAMONDS; SEMICONDUCTOR DOPING; THERMAL EFFECTS;

EID: 0037340204     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/18/3/309     Document Type: Article
Times cited : (172)

References (22)
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    • High temperature point-contact transistors and Schottky diodes formed on synthetic boron-doped diamond
    • Geis M W, Rathamn D D, Ehrlich D J, Murphy R A and Lindley W T 1987 High temperature point-contact transistors and Schottky diodes formed on synthetic boron-doped diamond IEEE Electron Device Lett. 8 341-4
    • (1987) IEEE Electron Device Lett. , vol.8 , pp. 341-344
    • Geis, M.W.1    Rathamn, D.D.2    Ehrlich, D.J.3    Murphy, R.A.4    Lindley, W.T.5
  • 6
    • 0033879748 scopus 로고    scopus 로고
    • High voltage GaN Schottky rectifier
    • Dang G T 2000 High voltage GaN Schottky rectifier IEEE Trans. Electron Devices 47 692-4
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 692-694
    • Dang, G.T.1
  • 9
    • 0006472554 scopus 로고    scopus 로고
    • Hydrogen in wide bandgap semiconductors
    • ed J Stephen (Parkridge, New Jersey: Pearton Noyles Publication) ch 10
    • Pearton S J and Lee J/W (eds) 2000 Hydrogen in wide bandgap semiconductors Processing of Wide Band Gap Semiconductors ed J Stephen (Parkridge, New Jersey: Pearton Noyles Publication) ch 10 pp 429-505
    • (2000) Processing of Wide Band Gap Semiconductors , pp. 429-505
    • Pearton, S.J.1    Lee, J.W.2
  • 10
    • 0033893367 scopus 로고    scopus 로고
    • Hydrogen and doping issues in wide band gap semiconductors
    • Chevallier J 2000 Hydrogen and doping issues in wide band gap semiconductors Mater. Sci. Eng. B 71 62-82
    • (2000) Mater. Sci. Eng. B , vol.71 , pp. 62-82
    • Chevallier, J.1
  • 16
    • 0033745793 scopus 로고    scopus 로고
    • Deep-level transient spectroscopy in the depletion zone of boron-doped homoepitaxial diamond films
    • Muret P, Saby C, Pruvost F and Deneuville A 2000 Deep-level transient spectroscopy in the depletion zone of boron-doped homoepitaxial diamond films Diam. Relat. Mater. 9 1041-5
    • (2000) Diam. Relat. Mater. , vol.9 , pp. 1041-1045
    • Muret, P.1    Saby, C.2    Pruvost, F.3    Deneuville, A.4
  • 20
    • 0003597031 scopus 로고
    • (Washington DC, USA: Material Science Research Center of Excellence Howard University)
    • Harris G L (ed) 1995 Properties of Silicon Carbide (Washington DC, USA: Material Science Research Center of Excellence Howard University)
    • (1995) Properties of Silicon Carbide
    • Harris, G.L.1
  • 21
    • 0003660629 scopus 로고
    • (Washington DC: National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council, NMAB-471 National Academy Press)
    • Material for High-Temperature Semiconductor Devices 1995 (Washington DC: National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council, NMAB-471 National Academy Press)
    • (1995) Material for High-Temperature Semiconductor Devices


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.