Hole traps in natural type lib diamond

IEEE Transactions on Electron Devices

Volumn 44, Issue 9, 1997, Pages 1514-1522

  Geis, Michael W ^a   Twichell, Jonathan C ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CAPACITANCE; ELECTRIC FIELDS; SCHOTTKY BARRIER DIODES;

HOLE TRAPS;

SEMICONDUCTING DIAMONDS;

EID: 0031235337     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.622609     Document Type: Article

References (19)

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