Electromigration effects upon interfacial reactions

JOM

Volumn 55, Issue 2, 2003, Pages 62-67

  Chen, Sinn Wen ^a   Chen, Chih Ming ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; INTEGRATED CIRCUITS; JOINTS (STRUCTURAL COMPONENTS); MICROELECTRONICS; PELTIER EFFECT; SURFACE REACTIONS;

CONDUCTION LINES;

ELECTROMIGRATION;

EID: 0037297140     PISSN: 10474838     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11837-003-0230-8     Document Type: Review

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