High-spatial resolution resistivity mapping of large-area YBCO films by a near-field millimeter-wave microscope

IEEE Transactions on Microwave Theory and Techniques

Volumn 44, Issue 7 PART 2, 1996, Pages 1390-1392

  Golosovsky, Michael ^a   Galkin, Alexander ^a   Davidov, Dan ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNA RADIATION; ELECTRIC CONDUCTIVITY; ELECTROMAGNETIC WAVE TRANSMISSION; ELECTROMAGNETIC WAVES; MICROSCOPES; MICROWAVE MEASUREMENT; MILLIMETER WAVE DEVICES; PROBLEM SOLVING; SCANNING; WAVEGUIDES; YTTRIUM COMPOUNDS;

NEAR FIELD MILLIMETER WAVE MICROSCOPE; RESISTIVITY MAPPING;

SUPERCONDUCTING FILMS;

EID: 0030193179     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.508246     Document Type: Article

References (14)

1. R. Wiesendanger, Scanning Probe Microscopy and Speclroscopy. U.K.: Cambridge Univ. Press, 1994.
2. R. Gerber, D. Quenter, T. Doderer, C. A. Kruclle, R. P. Hucbcner, F. Muller, J. Niemeyer, R. Popel, and T. Weimann, Quantitative measurement of the microwave distribulion in superconducting tunnel junctions, Appl. Phys. Lett, vol. 66, pp. 1554-1556, 1995.
3. J. J. Kopanski, J. R. Lowney, D. S. Miles, D. B. Novotny, and G. P. Carver, High spatial resolution mapping of resistivity variations in semiconductors, Solid-State Electronics, vol. 35, pp. 423-433, 1992.
4. J. S. Martens, V. M. Hietala, D. S. Ginley, T. E. Zipperian, and G. K. G. Hobenwarter, Confocal resonators for measuring the surface resistance of high-temperature superconducting films, Appl, Phys. Lett., vol. 58, pp. 2543-2545, 1991.
5. A. T. Fiory, A. F. Hebard, P. M. Mankiewich, and R. E. Howard, Penetration depths of high-7 r films measured by two coil mutual inductance, Appl. Phys. Lett., vol. 52; pp. 2165-2167, 1988.
6. E. A. Ash, G. Nicholls, Super-resolution aperture scanning microscope, Nature, vol 237, pp. 51Ü 512, 1972.
7. C. A. Bryant and J. B. Gunn, Noncomact technique for the local measuremenl of semicomluclor resistivity, Rev. Sei. Instr., vol. 36, pp. 1614-1617, 1965.
8. |8] R. Merz, F. Kellmann, R. J, Haug and K. Ploog, Nonequilibrium edgestate transport resolved by far-infrared microscopy, Phys. Rev. Lett., vol. 70. pp. 651-653, 1993.
9. E. J. Spada, V. R. Rao. I. Bhat, and J. M. Borrego, Non-destructive characterization of HgCdTe using photoinduced microwave refelection, Semlcond. Sei. Technol., vol. 8, pp. 937-940, 1993.
10. [101 M. Tabib-Azar. N. S. Shoemaker, and S. Harris, Nondestructive characterization of materials by evanescent microwaves, Meas. Sei. Technol., vol. 4, pp. 583-590, 1993.
11. [Ill R. C. Black, F. C. Wellstood, E. Dantsker, A. H. Miklich, D. T. Nemeth, D. Koelle, F. Ludwig, and 1. Clarke, Microwave microscopy using a superconducting quantum inlerference device,1' Appl. Phvs. Lett., vol. 66, pp. 99-101, 1995.
12. T. Moreno, Microwave transmission Design Data. Dover. 1958, p. 154.
13. V. F. Velcy, Modern Microwave Technology. Englewood Cliffs, NJ: Prentice Hall, 1987, p. 157.
14. A. Andreone, A. Cassinese, M. lavarone, R. Vaglio, I. I. Kulik, aud V. Palmieri, Relation between normal-sate and superconductive properties of niobium sputtered films, Phys. RPV. R., in press.