Scanning tip microwave near-field microscope

Applied Physics Letters

Volumn 68, Issue 24, 1996, Pages 3506-3508

  Wei, T ^a   Xiang, X D ^a   Wallace Freedman, W G ^b   Schultz, P G ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001486181     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115773     Document Type: Article

References (12)

1. X.-D. Xiang, X. Sun, G. Briceno, Y. Lou, K.-A. Wang, H. Chang, W. G. Wallace-Freedman, S.-W. Chen, and P. G. Schultz, Science INS 268, 1738 (1995).
2. G. Briceno, H. Chang, X. Sun, P. G. Schultz, and X.-D. Xiang, Science INS 270, 273 (1995).
3. E. H. Synge, Philos. Mag. 6, 356 (1928).
4. R. F. Soohoo, J. Appl. Phys. AIP 33, 1276 (1962).
5. E. A. Ash and G. Nicholls, Nature 237, 510 (1972).
6. R. J. Gutmann, J. M. Borrego, P. Chakrabarti, and M.-s. Wang, IEEE MTT-S Digest, 281 (1987); M. Tabib-Azar, N. S. Shoemaker, and S. Harris, ibid. 583 (1993).
7. D. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. AIP 44, 651 (1984).
8. A. Lewis, M. Issacson, A. Haratounian, and A. Murray, Ultramicroscopy INS 13, 227 (1984).
9. R. C. Black, F. C. Wellstood, E. Dantsker, A. H. Miklich, D. T. Nemeth, D. Koelle, F. Ludwig, and J. Clarke, Appl. Phys. Lett. AIP 66, 99 (1995).
10. E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, Science INS 251, 1468 (1991).
11. F. Zenhausern, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. AIP 65, 1623 (1994).
12. X.-D. Xiang, J. W. Brill, and W. L. Fuqua, Rev. Sci. Instrum. AIP 60, 3035 (1989).