Tip-sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging

Review of Scientific Instruments

Volumn 71, Issue 6, 2000, Pages 2414-2417

  Duewer, Fred ^a   Gao, C ^a   Xiang, X D ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000660197     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150629     Document Type: Article

References (12)

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