Near-field scanning microwave microscope with 100 μm resolution

Applied Physics Letters

Volumn 69, Issue 21, 1996, Pages 3272-3274

  Vlahacos, C P ^a   Black, R C ^a,b   Anlage, S M ^a   Amar, A ^a   Wellstood, F C ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b Quantum Design   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000738890     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118033     Document Type: Article

References (13)

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