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Volumn 14, Issue 16, 2002, Pages 4101-4117

Structural studies of epitaxial ultrathin oxide films and nanoclusters by means of angle-scanned photoelectron diffraction (XPD)

(3) Granozzi, Gaetano a Rizzi, G Andrea a Sambi, Mauro a

a UNIVERSITY OF PADOVA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; EVAPORATION; HOLOGRAPHY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NANOSTRUCTURED MATERIALS; OXIDATION; SINGLE CRYSTALS; SUBSTRATES; SURFACE STRUCTURE; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

X-RAY PHOTOELECTRON DIFFRACTION (XPD);

ULTRATHIN FILMS;

EID: 0037193243 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/14/16/304 Document Type: Conference Paper

Times cited : (10)

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