Angle-scanned photoelectron diffraction: Probing crystalline ultrathin films

Advanced Materials

Volumn 8, Issue 4, 1996, Pages 315-326

  Granozzi, Gaetano ^a   Sambi, Mauro ^a  

^a UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELECTRON DIFFRACTION; ELECTRON SCATTERING; LOW ENERGY ELECTRON DIFFRACTION; MATHEMATICAL MODELS; SCANNING TUNNELING MICROSCOPY; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

ANGLE SCANNED PHOTOELECTRON DIFFRACTION; CRYSTALLINE THIN FILMS; GLANCING ANGLE GEOMETRY; QUALITATIVE STRUCTURAL INFORMATION; SCATTERING MODELS; STRUCTURAL DEFECTS; SURFACE ATOMIC LAYERS; TRIAL AND ERROR FITTING;

ULTRATHIN FILMS;

EID: 0030120680     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.19960080407     Document Type: Article

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