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Surface Science

Volumn 436, Issue 1, 1999, Pages 227-236

Ultrathin VOx/TiO2(110) (x ≈ 1) film preparation by controlled oxidation of metal deposits

(3) Della Negra, Michela a Sambi, Mauro a Granozzi, Gaetano a

a UNIVERSITY OF PADOVA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL VARIABLES CONTROL; EPITAXIAL GROWTH; FILM PREPARATION; OXIDATION; TEMPERATURE; THICKNESS MEASUREMENT; TITANIUM DIOXIDE; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

IN SITU STRUCTURAL CHARACTERIZATION; PHOTOELECTRON DIFFRACTION; VANADIUM OXIDES;

ULTRATHIN FILMS;

EID: 0033365510 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)00666-4 Document Type: Article

Times cited : (34)

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