Polarization effects to enhance surface sensitivity of angle-scanned X-ray photoelectron diffraction in synchrotron-radiation-based experiments

Surface Science

Volumn 415, Issue 3, 1998, Pages

  Sambi, Mauro ^a   Granozzi, Gaetano ^a  

^a UNIVERSITY OF PADOVA   (Italy)

Author keywords

Photoelectron diffraction; Surface relaxation and reconstruction

Indexed keywords

ANISOTROPY; CALCULATIONS; COMPUTER SIMULATION; CRYSTALS; GEOMETRY; LIGHT POLARIZATION; MATHEMATICAL MODELS; MULTILAYERS; RELAXATION PROCESSES;

ANGLE SCANNED X RAY PHOTOELECTRON DIFFRACTION; SURFACE RECONSTRUCTION; SURFACE RELAXATION; SURFACE SENSITIVITY;

SURFACES;

EID: 0032500389     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00443-9     Document Type: Article

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