Ordered binary oxide films of v2O3(0001) on Al 2O3

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 4, 1999, Pages 1887-1892

  Guo, Q ^a   Kim, D Y ^a   Street, S C ^a,b   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

^b UNIVERSITY OF ALABAMA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDE FILMS; ANALYTICAL TECHNIQUES; BINARY OXIDES; ELECTRON LOSS; HIGH RESOLUTION; ION SCATTERING SPECTROSCOPY; LOW TEMPERATURES; METAL-TO-INSULATOR TRANSITIONS; MO(110); STRUCTURAL MEASUREMENTS; ULTRAHIGH VACUUM CONDITIONS; VANADIA; VANADIUM OXIDES;

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; METAL INSULATOR TRANSITION; MOLYBDENUM; MOLYBDENUM OXIDE; OXIDES; VANADIUM; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDE FILMS;

EID: 78649789536     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581699     Document Type: Conference Paper

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