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Volumn 497, Issue 1-3, 2002, Pages 47-58

New features of the Si(1 0 0)-c(4 × 4) reconstruction observed with STM: Suggestion of the structure with lowered symmetry

Author keywords

Low index single crystal surfaces; Scanning tunneling microscopy; Semi empirical models and model calculations; Silicon; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; DIMERS; MATHEMATICAL MODELS; POINT DEFECTS; RELAXATION PROCESSES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SINGLE CRYSTALS;

EID: 0037137867     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01623-5     Document Type: Article
Times cited : (19)

References (40)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.