Static time-of-flight secondary ion mass spectrometry of monolayers on scribed silicon derived from 1-alkenes, 1-alkynes, and 1-haloalkanes

Langmuir

Volumn 18, Issue 12, 2002, Pages 4840-4846

  Lua, Yit Yian ^a   Niederhauser, Travis L ^a   Matheson, Reija ^a   Bristol, Cara ^a   Mowat, Ian A ^b   Asplund, Matthew C ^a   Linford, Matthew R ^a  

^a Brigham Young University   (United States)

^b CHARLES EVANS AND ASSOCIATES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DECOMPOSITION; OLEFINS; PARAFFINS; SECONDARY ION MASS SPECTROMETRY; SILICON; SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

TIME-OF-FLIGHT (TOF);

MONOLAYERS;

EID: 0037062799     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0115132     Document Type: Article

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