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Volumn 96, Issue 4, 1996, Pages 1261-1290

Atomically-resolved studies of the chemistry and bonding at silicon surfaces

Author keywords

[No Author keywords available]

Indexed keywords


EID: 4544236018     PISSN: 00092665     EISSN: None     Source Type: Journal    
DOI: 10.1021/cr950213k     Document Type: Article
Times cited : (176)

References (238)
  • 7
    • 0038186820 scopus 로고
    • Behm, R. J., Garcia, N., Rohrer, H., Eds.; Kluwer: Dordrecht, Boston, New York
    • Tersoff, J. In Scanning Tunneling Microscopy and Related Methods; Behm, R. J., Garcia, N., Rohrer, H., Eds.; Kluwer: Dordrecht, Boston, New York, 1990; Vol. 184, pp 77.
    • (1990) Scanning Tunneling Microscopy and Related Methods , vol.184 , pp. 77
    • Tersoff, J.1
  • 54
    • 0001446932 scopus 로고
    • Shen, T. C.; et al. Science 1995, 268, 1590.
    • (1995) Science , vol.268 , pp. 1590
    • Shen, T.C.1
  • 238
    • 85033027865 scopus 로고    scopus 로고
    • submitted for publication
    • Wang, Y.; Hamers, R. J. submitted for publication, 1996.
    • (1996)
    • Wang, Y.1    Hamers, R.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.