Characteristic faults and spectral information for logic BIST

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 2002, Pages 294-298

  Chen, Xiaoding ^a   Hsiao, Michael S ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXECUTION TIMES; HADAMARD COEFFICIENTS; SPECTRAL NOISE; SYSTEM-ON-A-CHIP;

ALGORITHMS; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN; RESPONSE TIME (COMPUTER SYSTEMS); SEQUENTIAL CIRCUITS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; VLSI CIRCUITS;

BUILT-IN SELF TEST;

EID: 0036912730     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/774572.774616     Document Type: Conference Paper

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