On using machine learning for logic BIST

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 338-346

  Fagot, Christophe ^a   Girard, Patrick ^a   Landrault, Christian ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER HARDWARE; COMPUTER SIMULATION; LEARNING SYSTEMS;

BUILT IN SELF TEST (BIST);

INTEGRATED CIRCUIT TESTING;

EID: 0031361729     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (31)