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Volumn 11, Issue 4, 2002, Pages 322-329

IR uncooled bolometers based on amorphous GexSi1-xOy on silicon micromachined structures

Author keywords

Amorphous GexSi1 xOy; Bolometers; Bulk micromachining; Sputtering

Indexed keywords

ELECTRIC CONDUCTIVITY; INFRARED RADIATION; INTEGRATED CIRCUITS; MICROMACHINING; SILICON; SPUTTERING; THERMAL CONDUCTIVITY;

EID: 0036687776     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/JMEMS.2002.800926     Document Type: Article
Times cited : (64)

References (23)
  • 4
    • 0001572358 scopus 로고
    • Application of interferometric enhancement to self-absorbing thin film thermal IR detectors
    • (1993) Infrared Phys. , vol.34 , pp. 379-387


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.