Atomic resolution imaging of Si(1 0 0)1 × 1:2H dihydride surface with noncontact atomic force microscopy (NC-AFM)

Applied Surface Science

Volumn 188, Issue 3-4, 2002, Pages 272-278

  Araragi, S ^a   Yoshimoto, A ^a   Nakata, N ^a   Sugawara, Y ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Hydrogen; Noncontact atomic force microscopy; Si(1 0 0)1 1:2H dihydride surface; The attractive force; The repulsive force; Tip sample distance dependence

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON;

ATOMIC RESOLUTION IMAGING;

SURFACE STRUCTURE;

EID: 0037187238     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00938-2     Document Type: Conference Paper

References (15)