Photothermal characterization of optical thin film coatings

Optical Engineering

Volumn 36, Issue 1, 1997, Pages 251-262

  Wu, Z L ^a   Thomsen, M ^a   Kuo, P K ^b   Lu, Yuesheng ^b   Stolz, Christopher ^c   Kozlowski, Mark ^c  

^a EASTERN MICHIGAN UNIVERSITY   (United States)

^b WAYNE STATE UNIVERSITY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Laser damage; Localized defects; Nondestructive evaluation; Optical absorption; Optical thin films; Overview; Photothermal technique; Thermal conductivity

Indexed keywords

EID: 5944239558     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601125     Document Type: Article

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