Damage threshold prediction of hafnia–silica multilayer coatings by nondestructive evaluation of fluence–limiting defects

Applied Optics

Volumn 40, Issue 12, 2001, Pages 1897-1906

  Wu, Zhouling ^a,c   Stolz, Christopher J ^a   Weakley, Shannon C ^a   Hughes, James D ^a   Zhao, Qiang ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b EASTERN MICHIGAN UNIVERSITY   (United States)

^c Oplink Communications Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE ABSORPTION; HAFNIUM; LASERS; MICROSCOPIC EXAMINATION; MULTILAYERS; SILICA;

PHOTOTHERMAL MICROSCOPY;

OPTICAL COATINGS;

EID: 0037488487     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.001897     Document Type: Article

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