Beam characterization: Application to the laser damage threshold

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3578, Issue , 1999, Pages 633-644

  Hue, J ^a   Dijon, J ^a   Garrec, P ^a   Ravel, G ^a   Poupinet, L ^a   Lyan, P ^a  

^a CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CONTINUOUS WAVE LASERS; LASER PULSES; MIRRORS; SILICON WAFERS; VISUALIZATION;

KNIFE-EDGE METHOD; PEAK FLUENCE MEASUREMENT;

LASER DAMAGE;

EID: 0032682141     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.344398     Document Type: Conference Paper

References (19)