Rear-surface laser damage on 355-nm silica optics owing to fresnel diffraction on front-surface contamination particles

Applied Optics

Volumn 39, Issue 21, 2000, Pages 3654-3663

  Génin, François Y ^a   Feit, Michael D ^a   Kozlowski, Mark R ^a   Rubenchik, Alexander M ^a   Yoshiyama, James ^a   Salleo, Alberto ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; CONTAMINATION; DIFFRACTION; IRRADIATION; LASER DAMAGE; LENSES; LIGHT INTERFERENCE;

LIGHT INTENSITY MODULATIONS;

OPTICS;

EID: 0000868329     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.003654     Document Type: Article

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