Characterization of surface and sub-surface defects in optical materials using near field evanescent wave

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3578, Issue , 1999, Pages 718-720

  Yan, M ^a   Oberhelman, S ^a   Siekhaus, W ^a   Wu, Z L ^a   Sheehan, L ^a   Kozlowski, M ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; FUSED SILICA; IMAGE ANALYSIS; LASER DAMAGE; OPTICAL COATINGS; OPTICAL GLASS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES;

EVANESCENT WAVES; NEAR FIELD SCANNING OPTICAL MICROSCOPY (NSOM);

OPTICAL MATERIALS;

EID: 0032631164     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (0)