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Volumn 172, Issue 3-4, 2001, Pages 253-259

High energy photoemission investigations of SiO2/SiC samples

c DESY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ETCHING; GRAPHITE; INTERFACES (MATERIALS); PHOTOEMISSION; PHOTONS; SILICA; SILICON CARBIDE;

HIGH ENERGY PHOTOEMISSION;

DIELECTRIC MATERIALS;

EID: 0034831453 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(00)00858-8 Document Type: Article

Times cited : (27)

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