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Volumn 68, Issue 15, 1996, Pages 2141-2143
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Elimination of SiC/SiO2 interface states by preoxidation ultraviolet-ozone cleaning
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000102171
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.115611 Document Type: Article |
Times cited : (126)
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References (12)
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