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Volumn 68, Issue 15, 1996, Pages 2141-2143

Elimination of SiC/SiO2 interface states by preoxidation ultraviolet-ozone cleaning

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000102171     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115611     Document Type: Article
Times cited : (126)

References (12)
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    • 22244463675 scopus 로고    scopus 로고
    • G. Pensl, V. V. Afanas'ev, M. Bassler, T. Troffer, J. Heindl, H. P. Strunk, M. Maier, and W. J. Choyke, presented at ICSCRM'95, Kyoto, 1995 (in press)
    • G. Pensl, V. V. Afanas'ev, M. Bassler, T. Troffer, J. Heindl, H. P. Strunk, M. Maier, and W. J. Choyke, presented at ICSCRM'95, Kyoto, 1995 (in press).
  • 7
    • 0346398961 scopus 로고    scopus 로고
    • V. V. Afanas'ev, M. Bassler, G. Pensl, M. J. Schulz, and E. Stein von Kamienski, J. Appl. Phys. 79, 3108 (1996)
    • V. V. Afanas'ev, M. Bassler, G. Pensl, M. J. Schulz, and E. Stein von Kamienski, J. Appl. Phys. 79, 3108 (1996).
  • 9
    • 85045825384 scopus 로고    scopus 로고
    • V. K. Adamchuk and V. V. Afanas'ev, Prog. Surf. Sci. 41, 109 (1992)
    • V. K. Adamchuk and V. V. Afanas'ev, Prog. Surf. Sci. 41, 109 (1992).
  • 12
    • 84950873117 scopus 로고    scopus 로고
    • T. Yamamoto, Y. Mishima, H. Hirose, and Y. Osaka, Jpn. J. Appl. Phys. 20, Suppl. 2, 185 (1981)
    • T. Yamamoto, Y. Mishima, H. Hirose, and Y. Osaka, Jpn. J. Appl. Phys. 20, Suppl. 2, 185 (1981).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.