Clustering based evaluation of IDDQ measurements: applications in testing and classification of ICs

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 444-449

  Jandhyala, Sri ^a   Balachandran, Hari ^a   Sengupta, Manidip ^a   Jayasumana, Anura P ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FAILURE ANALYSIS; QUALITY CONTROL; SEMICONDUCTING SILICON; STATISTICAL METHODS;

CLUSTERING BASED EVALUATION; SINGLE THRESHOLD APPROACH;

INTEGRATED CIRCUIT TESTING;

EID: 0033749948     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)