A comprehensive approach for modeling and testing analog and mixed-signal devices

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 169-176

  Souders, T Michael ^a   Stenbakken, Gerard N ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; DATA CONVERSION, ANALOG TO DIGITAL; DATA CONVERSION, DIGITAL TO ANALOG; ELECTRONIC CIRCUITS--TESTING; MATHEMATICAL MODELS;

ANALOG DEVICES; MIXED SIGNAL DEVICES; SOFTWARE PACKAGES;

ELECTRONIC EQUIPMENT TESTING;

EID: 0025480911     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)