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Journal of Mass Spectrometry

Volumn 37, Issue 7, 2002, Pages 699-708

Quantification of grafted poly(ethylene glycol)-silanes on silicon by time-of-flight secondary ion mass spectrometry

(5) Norrman, K a Papra, A b Kamounah, F S c Gadegaard, N a Larsen, N B a

a TECHNICAL UNIVERSITY OF DENMARK (Denmark)

b UNIVERSITY MEDICAL CENTER HAMBURG EPPENDORF (Germany)

c UNIVERSITY OF COPENHAGEN (Denmark)

Author keywords

Poly(ethylene glycol); Protein adsorption; Quantification; Silanes; Time of flight secondary ion mass spectrometry

Indexed keywords

ADSORPTION; CALIBRATION; GRAFTING (CHEMICAL); MASS SPECTROMETRY; SILANES; SILICON;

QUANTIFICATION;

POLYETHYLENE GLYCOLS;

MACROGOL; SILANE; SILICON;

ADSORPTION; ARTICLE; CALIBRATION; CHEMICAL ANALYSIS; CONTROLLED STUDY; MASS SPECTROMETRY; MOLECULAR WEIGHT; PRIORITY JOURNAL; SIGNAL PROCESSING; THICKNESS;

EID: 0036316442 PISSN: 10765174 EISSN: None Source Type: Journal
DOI: 10.1002/jms.330 Document Type: Article

Times cited : (21)

References (63)

1
- 0033900637
- (2000) Langmuir , vol.16 , pp. 2756
- Thom, V.¹ Altankov, G.² Groth, Th.³ Jankova, K.⁴ Jonsson, G.⁵ Ulbricht, M.⁶

2
- 0035954473
- (2001) Langmuir , vol.17 , pp. 4090
- Papra, A.¹ Bernard, A.² Juncker, D.³ Larsen, N.B.⁴ Michel, B.⁵ Delamarche, E.⁶

3
- 0001816926
- Harris JM (Ed.). Plenum Press: New York
- (1992) Poly(ethylene Glycol) Chemistry. Biotechnical and Biomedical Applications , pp. 1
- Harris, J.M.¹

4
- 0032079047
- (1998) Biomaterials , vol.19 , pp. 953
- Zhang, M.¹ Desai, T.² Ferrari, M.³

5
- 0343907711
- (1997) Colloids and Surfaces A , vol.123 , pp. 297
- Holmberg, K.¹ Tiberg, F.² Malmsten, M.³ Brink, C.⁴

6
- 12044254336
- (1993) Journal of the American Chemical Society , vol.115 , pp. 10714
- Prime, K.L.¹ Whitesides, G.M.²

7
- 0032115878
- (1998) Macromolecules , vol.31 , pp. 5059
- Sofia, S.J.¹ Premnath, V.² Merrill, E.W.³

8
- 0000490038
- (1995) Langmuir , vol.11 , pp. 3068
- Schröben, C.G.P.H.¹ Stuart, M.A.C.² Voort Maarschalk van der, K.³ Padt van der, A.⁴ Van't Riet, K.⁵

9
- 0029724374
- (1996) Annual Review of Materials Science , vol.26 , pp. 365
- Elbert, D.L.¹ Hubbell, J.A.²

10
- 0035815011
- (2001) Langmuir , vol.17 , pp. 1457
- Papra, A.¹ Gadegaard, N.² Larsen, N.B.³

11
- 0003708013
- Cambridge University Press: Cambridge
- (1998) Surface Analysis of Polymers by XPS and Static SIMS
- Briggs, D.¹

12
- 0345045361
- (1999) Langmuir , vol.15 , pp. 2773
- Stevens, M.J.¹

13
- 0034274657
- (2000) Journal of Nuclear Materials , vol.281 , pp. 42
- Behrisch, R.¹ Mayer, M.² Jacob, W.³ Assmann, W.⁴ Dollinger, G.⁵ Bergmaier, A.⁶ Kreissig, U.⁷ Friedrich, M.⁸ Sun, G.Y.⁹ Hildebrandt, D.¹⁰ Akbi, M.¹¹ Schneider, W.¹² Schleussner, D.¹³ Knapp, W.¹⁴ Edelmann, C.¹⁵

14
- 0024275747
- (1988) Nuclear Instruments and Methods in Physics Research, Section B , vol.35 , pp. 420
- Botha, A.P.¹ Strydom, H.J.² Marais, M.A.³

15
- 0023844570
- (1988) Polymer Communications , vol.29 , pp. 6
- Briggs, D.¹ Ratner, B.D.²

16
- 0032090086
- (1998) Pramana-Journal of Physics , vol.50 , pp. 617
- Chakraborty, P.¹

17
- 0022812598
- (1986) Vacuum , vol.36 , pp. 861
- Clark, E.A.¹

18
- 0026136706
- (1991) Surface and Interface Analysis , vol.17 , pp. 177
- Crapper, M.D.¹ Chew, A.² Bradley, R.H.³ Sykes, D.E.⁴

19
- 0033738191
- (2000) Journal of the Electrochemical Society , vol.147 , pp. 1915
- De Witte, H.¹ De Gendt, S.² Douglas, M.³ Conard, T.⁴ Kenis, K.⁵ Mertens, P.W.⁶ Vandervorst, W.⁷ Gijbels, R.⁸

20
- 0026938247
- (1992) Applied Surface Science , vol.62 , pp. 131
- Fan, C.Z.¹ Jiang, N.² Qian, W.J.³

21
- 0030170512
- (1996) Surface and Interface Analysis , vol.24 , pp. 380
- Galuska, A.A.¹

22
- 0028530315
- (1994) Surface and Interface Analysis , vol.21 , pp. 703
- Galuska, A.A.¹

23
- 0031235948
- (1997) Surface and Interface Analysis , vol.25 , pp. 790
- Galuska, A.A.¹

24
- 0030736453
- (1997) Surface and Interface Analysis , vol.25 , pp. 1
- Galuska, A.A.¹

25
- 0035274696
- (2001) Surface and Interface Analysis , vol.31 , pp. 177
- Galuska, A.A.¹

26
- 0000428194
- (1997) Journal of Vacuum Science and Technology B , vol.15 , pp. 2037
- Gerardi, C.¹ Giannini, C.² Passaseo, A.³ Tapfer, L.⁴

27
- 0035272636
- (2001) Journal of Vacuum Science and Technology A , vol.19 , pp. 568
- Gillen, G.¹ King, L.² Freibamn, B.³ Lareau, R.⁴ Bennett, J.⁵ Chmara, F.⁶

28
- 84881153760
- (1994) Journal of Vacuum Science and Technology A , vol.12 , pp. 452
- Gnaser, H.¹

29
- 0030212774
- (1996) Surface and Interface Analysis , vol.24 , pp. 483
- Gnaser, H.¹

30
- 0033583572
- (1999) Chemometrics and Intelligent Laboratory Systems , vol.47 , pp. 21
- Gouti, N.¹ van Espen, P.² Feinberg, M.H.³

31
- 0029783453
- (1996) Rapid Communications in Mass Spectrometry , vol.10 , pp. 1215
- Gusev, A.I.¹ Muddiman, D.C.² Proctor, A.³ Sharkey, A.G.⁴ Hercules, D.M.⁵ Tata, P.N.V.⁶ Venkataramanan, R.⁷

32
- 0343484935
- (2000) Polymer , vol.41 , pp. 2339
- Henneuse-Boxus, C.¹ De Ro, A.² Bertrand, P.³ Marchand-Brynaert, J.⁴

33
- 0029180564
- (1995) Fresenius' Journal of Analytical Chemistry , vol.353 , pp. 785
- Holzbrecher, H.¹ Breuer, U.² Gastel, M.³ Becker, J.S.⁴ Dietze, H.J.⁵ Beckers, L.⁶ Bauer, S.⁷ Fleuster, M.⁸ Zander, W.⁹ Schubert, J.¹⁰ Buchal, C.¹¹

34
- 2142779574
- (1986) Mikrochimica Acta , vol.3 , pp. 105
- Kuroda, T.¹ Tamaki, S.²

35
- 2142725208
- In situ ion implantation for trace quantitative SIMS analysis of wide-band gap (WBG) electronic device materials
- Proceedings Institute of Physics Conference Series, IOP Publishing Ltd, Bristol
- (2000) Microbeam Analysis , pp. 329-330
- Lareau, R.T.¹ Wood, M.² Chmara, F.³

36
- 0031292298
- (1997) International Journal of Polymer Analysis and Characterization , vol.4 , pp. 133
- Leeson, A.M.¹ Alexander, M.R.² Short, R.D.³ Hearn, M.J.⁴ Briggs, D.⁵

37
- 0009732656
- (1995) Applied Surface Science , vol.90 , pp. 205
- Li, J.X.¹ Gardella, J.A.² McKeown, P.J.³

38
- 0027851489
- (1993) Surface and Interface Analysis , vol.20 , pp. 991
- Linton, R.W.¹ Mawn, M.P.² Belu, A.M.³ Desimone, J.M.⁴ Hunt, M.O.⁵ Menceloglu, Y.Z.⁶ Cramer, H.G.⁷ Benninghoven, A.⁸

39
- 42849083642
- (1994) Journal of Physical Chemistry , vol.98 , Issue.11 , pp. 570
- Muddiman, D.C.¹ Brockman, A.H.² Proctor, A.³ Houalla, M.⁴ Hercules, D.M.⁵

40
- 0028822334
- (1995) Journal of Mass Spectrometry , vol.30 , pp. 1469
- Muddiman, D.C.¹ Gusev, A.I.² Stoppeklangner, K.³ Pructor, A.⁴ Hercules, D.M.⁵ Tata, P.⁶ Venkataramanan, R.⁷ Diven, W.⁸

41
- 0030073465
- (1996) Applied Spectroscopy , vol.50 , pp. 161
- Muddiman, D.C.¹ Nicola, A.J.² Proctor, A.³ Hercules, D.M.⁴

42
- 0029690403
- (1996) Fresenius' Journal of Analytical Chemistry , vol.354 , pp. 103
- Muddiman, D.C.¹ Gusev, A.I.² Martin, L.B.³ Hercules, D.M.⁴

43
- 0035873358
- (2001) Applied Surface Science , vol.175 , pp. 678
- Novak, S.W.¹ Bekos, E.J.² Marino, J.W.³

44
- 0030215740
- (1996) Journal of Materials Research , vol.11 , pp. 1923
- Odom, R.W.¹ Grossbeck, M.L.²

45
- 0032235653
- (1998) Journal of the American Society for Mass Spectrometry , vol.9 , pp. 282
- Parees, D.M.¹ Hanton, S.D.² Clark, P.A.C.³ Willcox, D.A.⁴

46
- 0032030053
- (1998) Journal of Geochemical Exploration , vol.60 , pp. 241
- Pratt, A.R.¹ Huctwith, C.M.² van der Heide, P.A.W.³ McIntyre, N.S.⁴

47
- 0029196731
- (1995) Applied Surface Science , vol.84 , pp. 107
- Reihs, K.¹ Colom, R.A.² Gleditzsch, S.³ Deimel, M.⁴ Hagenhoff, B.⁵ Benninghoven, A.⁶

48
- 0032669741
- (1999) Applied Surface Science , vol.147 , pp. 14
- Seki, S.¹ Tamura, H.² Sumiya, H.³

49
- 0030120662
- (1996) Journal of the Japan Institute of Metals , vol.60 , pp. 406
- Sudo, Y.¹ Takeshita, H.T.² Suzuki, R.O.³ Tomii, Y.⁴ Ono, K.⁵

50
- 0029370547
- (1995) Journal of the Japan Institute of Metals , vol.59 , pp. 973
- Takeshita, H.T.¹ Tomii, Y.² Suzuki, R.O.³ Ono, K.⁴

51
- 0030109912
- (1996) Journal of the Japan Institute of Metals , vol.60 , pp. 290
- Takeshita, H.T.¹ Kagawa, T.² Suzuki, R.O.³ Oishi, T.⁴ Ono, K.⁵

52
- 84989093392
- (1995) Surface and Interface Analysis , vol.23 , pp. 163
- van der Heide, P.A.W.¹ Ramamuthy, S.² McIntyre, N.S.³

53
- 0034245028
- (2000) Surface and Interface Analysis , vol.30 , pp. 255
- Vanzetti, L.¹ Bersam, M.² Sbetti, M.³ Anderle, M.⁴

54
- 2142679840
- (1994) Mikrochimica Acta , vol.114 , pp. 107
- Werner, H.¹

55
- 0026851702
- (1992) Surface and Coatings Technology , vol.51 , pp. 358
- Wilson, R.G.¹ Stevie, F.A.² Lux, G.E.³ Kirschbaum, C.L.⁴ Frank, S.⁵ Pallix, J.⁶

56
- 0001353551
- (1992) Nuclear Instruments and Methods in Physics Research, Section B , vol.64 , pp. 621
- Wittmaack, K.¹

57
- 85010158759
- (1989) Geochemical Journal , vol.23 , pp. 215
- Yurimoto, H.¹ Yamashita, A.² Nishida, N.³ Sueno, S.⁴

58
- 0033884451
- (2000) Materials Science and Engineering B , vol.73 , pp. 173
- Zanderigo, F.¹ Ferrari, S.² Queirolo, G.³ Pello, C.⁴ Borgini, M.⁵

59
- 0001699339
- (1997) Fresenius' Journal of Analytical Chemistry , vol.358 , pp. 203
- Zastrow, U.¹ Loo, R.² Szot, R.³ Moers, J.⁴ Grabolla, T.⁵ Behammer, D.⁶ Vescan, L.⁷

60
- 0343953457
- (2000) Polymer , vol.41 , pp. 8321
- Zeng, X.M.¹ Chan, C.M.² Weng, L.T.³ Li, L.⁴

61
- 0009812111
- (1995) Analytical Chemistry , vol.67 , pp. 2901
- Zimmerman, P.A.¹ Hercules, D.M.² Loos, W.O.³

62
- 0033134722
- (1999) Journal of Microbiological Methods , vol.36 , pp. 3
- Beech, I.B.¹ Zinkevich, V.² Tapper, R.³ Gubner, R.⁴ Avci, R.⁵

63
- 33751554056
- (1990) Chemical and Engineering News , vol.68 , pp. 2
- Dobbs, D.A.¹ Bergman, R.G.² Theopold, K.H.³

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