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Volumn 4, Issue 2, 1997, Pages 133-151

Quantitative tof SIMS analysis of spun-cast and solution-cast polymer films

Author keywords

Film thickness; Molecular weight; Poly(methyl methacrylate); Time of flight secondary ion mass spectrometry (ToF SIMS)

Indexed keywords


EID: 0031292298     PISSN: 1023666X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10236669708033942     Document Type: Article
Times cited : (8)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.