Characterization of ultrathin poly(ethylene glycol) monolayers on silicon substrates

Langmuir

Volumn 17, Issue 5, 2001, Pages 1457-1460

  Papra, Alexander ^a   Gadegaard, Nikolaj ^a   Larsen, Niels B ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

X-RAY REFLECTIVITIES;

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; GRAFTING (CHEMICAL); HYDROPHILICITY; POLYETHYLENE GLYCOLS; SILICON WAFERS; SURFACE REACTIONS; SURFACE ROUGHNESS; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

MONOLAYERS;

EID: 0035815011     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la000609d     Document Type: Article

References (29)

1. Thom, V.H.; Altankov, G.; Groth, Th.; Jankova, K.; Jonsson, G.; Ulbricht, M. Langmuir 2000, 16, 2756.
2. Harris, J.M. In Poly(ethylenglycol) chemistry. Biotechnical and biomedical applications; Plenum Press: New York, 1992.
3. Holmberg, K.; Tiberg, F.; Malmsten, M.; Brink, C. Colloids Surf, A 1997, 123, 297.
4. Zhang, M.; Desai, T.; Ferrari, M. Biomaterials 1998, 19, 953.
5. Prime, K.L.; Whitesides, G.M. J. Am. Chem. Soc. 1993, 115, 10714.
6. Malmsten, M.; Emoto, K.; Van Alstine, J.M. J. Colloid. Interface Sci. 1998, 202, 507.
7. Sofia, S.J.; Premnath, V.; Merrill, E.W. Macromolecules 1998, 31, 5059.
8. Yang, Z.; Galloway, J.A.; Yu, H. Langmuir 1999, 15, 8405.
9. Ulbricht, M.; Matuschewski., H.; Oechel., A.; Hicke, H.-G. J. Membr. Sci. 1996, 115, 31.
10. Holmberg, K.; Bergstrom, K.; Brink, C.; Osterberg, E.; Tiberg, F.; Harris, J.M. J. Adhes. Sci. Technol. 1993, 7, 503.
11. Malmsten, M.; Lassen, B.; Holmberg, K.; Thomas, V.; Quash, G. J. Colloid Interface Sci. 1996, 177, 70.
12. Kingshott, P.; Griesser, H.J. Curr. Opin. Solid State Mater. Sci. 1999, 4, 403.
13. Emoto, K.; Van Alstine, J.M.; Harris, J.M. Langmuir 1998, 14, 2722.
14. Sanderson, L.A.W.; Emoto, K.; Van Alstine, J.M.; Weimer, J.J. J. Colloid Interface Sci. 1998, 207, 180.
15. Dobbs, D.A.; Bergman, R.G.; Theopold, K.H. Chem. Eng. News 1990, 68 (17), 2.
16. The PEG layer is actually formed within the first 30 min. The samples investigated here were exposed to the respective reagent solution for 18 h, however.
17. Warren, B.E. X-ray Diffraction; Dover Publications: New York, 1990.
18. Bouwman, W.G.; Pedersen, J.S. J. Appl. Crystallogr. 1996, 29, 152.
19. McGovern, M.E.; Kallury, K.M.R.; Thompson, M. Langmuir 1994, 10, 3607.
20. Irvine, D.J.; Mayes, A.M.; Satija, S.K.; Barker, J.G.; Sofia-Allgor, S.J.; Griffith, L.G. J. Biomed. Mater. Res. 1998, 40, 298.
21. Parratt, L.G. Phys. Rev. 1954, 95, 359.
22. Parratt32 written by Christian Braun, HMI, Berlin, Germany. The program does not calculate the standard deviation of the parameters. The uncertainties are expected to be in the range of 5-10%.
23. Toney, M.F.; Mate, C.M.; Pocker, D. IEEE Trans. Magn. 1998, 34, 1774.
24. Dura, J.A.; Richter, C.A.; Majkrzak, C.F.; Nguyen, N.V. Appl. Phys. Lett. 1998, 73, 2131.
25. Yang, Z.; Galloway, J.A.; Yu, H. Langmuir 1999, 15, 8405.
26. Ashley, J.C. J. Electron Spectrosc. Relat. Phenom. 1982, 28, 177.
27. Jo, S.; Park, K. Biomaterials 2000, 21, 605.
28. Lin, Y.S.; Hlady, H.; Gölander, C.-G. Colloid Surf., B 1994, 3, 49.
29. 2). Subsequent XPS (probing nitrogen content from proteins) and XR (thickness) measurements confirmed these results.