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Volumn 138-139, Issue 138/3-4,139/1-4, 2002, Pages 181-193

Structural and chemical analysis of materials with high spatial resolution

(4) Van Benthem, Klaus a Krämer, Stephan a Sigle, Wilfried a Rühle, Manfred a

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

Convergent beam electron diffraction; Electron energy loss near edge structure; Electron energy loss spectroscopy; High resolution transmission electron microscopy; Transmission electron microscopy

Indexed keywords

PALLADIUM; STRONTIUM; TITANIUM;

ACCURACY; ANALYTIC METHOD; ATOMIC PARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CONFERENCE PAPER; CORRELATION ANALYSIS; ELECTRON DIFFRACTION; ENERGY; MOLECULAR DYNAMICS; QUANTITATIVE ANALYSIS; ROENTGEN SPECTROSCOPY; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036310375 PISSN: 00263672 EISSN: None Source Type: Journal
DOI: 10.1007/s006040200022 Document Type: Conference Paper

Times cited : (7)

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