High-Precision Measurement of Temperature Factors for NiAl by Convergent-Beam Electron Diffraction

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 54, Issue 2, 1998, Pages 147-157

  Nuchter W ^a   Weickenmeier, A L ^a   Mayer, J ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0542444977     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767397010969     Document Type: Article

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