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Volumn 166, Issue 1, 1998, Pages 367-379

Determination of bonding charge density in NiAl by quantitative convergent beam electron diffraction

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRON BEAMS; ELECTRON DIFFRACTION; SYNTHESIS (CHEMICAL);

EID: 0032023658     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199803)166:1<367::AID-PSSA367>3.0.CO;2-B     Document Type: Article
Times cited : (12)

References (22)
  • 8
  • 9
    • 0004370202 scopus 로고
    • A.G. Fox and C.G. SHIRLEY, J. Phys. F 13, 1581 (1983); A.G. Fox, J. Phys. F 13, 1593 (1983).
    • (1983) J. Phys. F , vol.13 , pp. 1593
    • Fox, A.G.1
  • 15
    • 85034297553 scopus 로고    scopus 로고
    • High precision measurement of temperature factors for NiAl by convergent beam electron diffraction
    • accepted for publication
    • W. NÜCHTER, A.L. WEICKENMEIER, and J. MAYER, High precision measurement of temperature factors for NiAl by convergent beam electron diffraction, Acta Cryst. A, accepted for publication.
    • Acta Cryst. A
    • Nüchter, W.1    Weickenmeier, A.L.2    Mayer, J.3
  • 20
    • 0003963128 scopus 로고
    • D. van Nostrand Company, Princeton (New Jersey) Eq. (4.9.2)
    • J.R. WOLBERG, Prediction analysis, D. van Nostrand Company, Princeton (New Jersey) 1967, Eq. (4.9.2).
    • (1967) Prediction Analysis
    • Wolberg, J.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.