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Volumn 20, Issue 1, 2002, Pages 68-75
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Combined effect of electrode gap and radio frequency on power deposition and film growth kinetics of SiH4/H2 discharges
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION EFFECTS;
DEPOSITION;
ELECTRIC VARIABLES MEASUREMENT;
ELECTRODES;
ELECTRON ENERGY LEVELS;
ENERGY GAP;
FILM GROWTH;
HEATING;
HYDROGEN;
OPTICAL VARIABLES MEASUREMENT;
REACTION KINETICS;
SILANES;
DISCHARGE RADICAL PRODUCTION EFFICIENCY;
ELECTRICAL DISCHARGE MEASUREMENTS;
ELECTRODE GAP;
ELECTRON HEATING;
FILM GROWTH KINETICS;
OHMIC HEATING;
OPTICAL DISCHARGE MEASUREMENTS;
POWER DEPOSITION;
SILICON;
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EID: 0036160483
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1421599 Document Type: Article |
Times cited : (16)
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References (44)
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